Thesis (Ph. D.)--University of Rochester. Dept. of Electrical and Computer Engineering, 2011.Reliability has become one of the most important metrics for on-chip communications infrastructures in nanoscale technologies. Reduced supply voltages and high clock frequency exacerbate the impact of noise sources such as particle strikes and crosstalk, which can cause transient errors in transmitted data. Manufacturing defects and aging issues can cause permanent errors in the communication links. The modularity of the Networks-on-Chip (NoCs) approach facilitates the exploration of error control techniques for on-chip interconnects and many-cores systems. Unfortunately, error control is not free. Worst-case error management methods are sim...