Compositional profiles across CdTe/Cd(y)Hg(1-y)Te interfaces in bulk specimens have been determined from backscattered electron (BSE) atomic-number contrast line profiles obtained using the scanning electron microscope. To improve the spatial resolution in the interface region, a numerical deconvolution method has been developed which enables the distorting effects associated with the beam size, the specimen scattering effects and the detector characteristics to be substantially removed from the BSE profile. The effectiveness of the method is demonstrated by reproducing closely the same compositional profile for individual specimens from BSE profiles obtained at different beam energies. The deconvolution method improved the resolution from ...
One knows the imaging system's properties are central to the correct interpretation of any image. In...
Abstract. 2014 Observations of semiconductor multilayers with backscattered electrons in a scanning ...
Of the conventional imaging signals in the scanning electron microscope (SEM), the secondary electro...
An outline is given of a method for high resolution BSE analysis of chemical composition across inte...
Backscattered electron (BSE) profiles from single interfaces in bulk cross-section semiconductor spe...
Two pairs of diametrically opposed Schottky surface barrier diodes in a modified scanning electron m...
The backscattered electron signal in scanning electron microscopy is sensitive to changes in the ato...
The main factors affecting the spatial resolution of the scanning electron microscope have been anal...
Backscattered-electron scanning electron microscopy (BSE-SEM) imaging is a valuable technique for ma...
Signal mixing technique using asymetrically placed backscattered electron detectors in a scanning el...
Observations of semiconductor multilayers with backscattered electrons in a scanning electron micros...
to the ongoing progress in nanotechnology, high resolution TEM investigations become more and more i...
Sometimes, the sample to be examined in the SEM will consist of a compositionally non-uniform substr...
Recently developed detectors can deliver high resolution and high contrast images of nanostructured ...
Quantification of different phases in multiphase materials and the determination of compositions in ...
One knows the imaging system's properties are central to the correct interpretation of any image. In...
Abstract. 2014 Observations of semiconductor multilayers with backscattered electrons in a scanning ...
Of the conventional imaging signals in the scanning electron microscope (SEM), the secondary electro...
An outline is given of a method for high resolution BSE analysis of chemical composition across inte...
Backscattered electron (BSE) profiles from single interfaces in bulk cross-section semiconductor spe...
Two pairs of diametrically opposed Schottky surface barrier diodes in a modified scanning electron m...
The backscattered electron signal in scanning electron microscopy is sensitive to changes in the ato...
The main factors affecting the spatial resolution of the scanning electron microscope have been anal...
Backscattered-electron scanning electron microscopy (BSE-SEM) imaging is a valuable technique for ma...
Signal mixing technique using asymetrically placed backscattered electron detectors in a scanning el...
Observations of semiconductor multilayers with backscattered electrons in a scanning electron micros...
to the ongoing progress in nanotechnology, high resolution TEM investigations become more and more i...
Sometimes, the sample to be examined in the SEM will consist of a compositionally non-uniform substr...
Recently developed detectors can deliver high resolution and high contrast images of nanostructured ...
Quantification of different phases in multiphase materials and the determination of compositions in ...
One knows the imaging system's properties are central to the correct interpretation of any image. In...
Abstract. 2014 Observations of semiconductor multilayers with backscattered electrons in a scanning ...
Of the conventional imaging signals in the scanning electron microscope (SEM), the secondary electro...
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