Warpage is known to be one of the primary molding issues during assembly of QFN package. It affects the package sawing process, and cause reliability issues. The main cause of warpage of area array packages is the coefficient thermal expansion (CTE) mismatch between the moulding compound and other components inside the package. The objective of this study is to investigate the warpage induced on the moulded strip of QFN package, by using different mold compounds which have different CTE values. The effect of thermal properties and filler content is also investigated. In this study, the QFN strips are moulded with different mould compounds. Nonlinear large deformation finite element analysis is performed to compare with the experimental resu...
© 2019 IEEE. The warpage induced during the manufacturing process affects the yield, quality, and re...
This project is to study and optimize the warpage of IC packages using statistical analysis. Design ...
The susceptibility of QFN package to delamination, particularly in the area between the Ni/Pd/Au lea...
Warpage is known to be one of the primary molding issues during assembly of QFN package. It affects ...
One of the latest developments in packaging technology is QFN (Quad Flat Non-lead) package. This pap...
One of the latest developments in packaging technology is QFN (Quad Flat Non-lead) package. This pap...
In this paper, both experimental and modeling works were resorted to analyze the warpage and wire sw...
In this paper, both experimental and modeling works were resorted to analyze the warpage and wire sw...
In this paper, both experimental and modeling works were resorted to analyze the warpage and wire sw...
The presence of thermal mismatch between different materials of plastic IC packages was found to cau...
Variation of processing conditions on warpage prediction of a plastic quad flat package (PQFP) is ex...
The effects of several important parameters, including processing conditions, package geometry and m...
Sensor packages have often to be adapted to current customer requirements. Dimensions, interior stru...
With the advancement of technology, semiconductor devices become more complex to satisfy the need fo...
One of the critical issues during assembly manufacturing process of semiconductor quad flat no-leads...
© 2019 IEEE. The warpage induced during the manufacturing process affects the yield, quality, and re...
This project is to study and optimize the warpage of IC packages using statistical analysis. Design ...
The susceptibility of QFN package to delamination, particularly in the area between the Ni/Pd/Au lea...
Warpage is known to be one of the primary molding issues during assembly of QFN package. It affects ...
One of the latest developments in packaging technology is QFN (Quad Flat Non-lead) package. This pap...
One of the latest developments in packaging technology is QFN (Quad Flat Non-lead) package. This pap...
In this paper, both experimental and modeling works were resorted to analyze the warpage and wire sw...
In this paper, both experimental and modeling works were resorted to analyze the warpage and wire sw...
In this paper, both experimental and modeling works were resorted to analyze the warpage and wire sw...
The presence of thermal mismatch between different materials of plastic IC packages was found to cau...
Variation of processing conditions on warpage prediction of a plastic quad flat package (PQFP) is ex...
The effects of several important parameters, including processing conditions, package geometry and m...
Sensor packages have often to be adapted to current customer requirements. Dimensions, interior stru...
With the advancement of technology, semiconductor devices become more complex to satisfy the need fo...
One of the critical issues during assembly manufacturing process of semiconductor quad flat no-leads...
© 2019 IEEE. The warpage induced during the manufacturing process affects the yield, quality, and re...
This project is to study and optimize the warpage of IC packages using statistical analysis. Design ...
The susceptibility of QFN package to delamination, particularly in the area between the Ni/Pd/Au lea...