Add to ORKGThe preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and transmission electron microscopy is of ultimate importance for understanding the mechanisms controlling crack propagation. In this paper, it will be shown that a focused ion beam machine equipped with an in situ micromanipulator is an ideal tool to systematically prepare such demanding samples. The methodology is described and discussed in detail, and several results are presented to demonstrate the potential of the technique
A site-specific technique for cross-section transmission electron microscopy specimen preparation of...
Commercially available focused ion beam (FIB) workstations with spatial resolution of 5-7 nm can pre...
The use of focused ion beam (FIB) milling for the preparation of transmission electron microscopy (T...
The preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and t...
The preparation of transmission electron microscope (TEM) thin foil specimens from metal alloys cont...
The preparation of transmission electron microscope (TEM) thin foil specimens from metal alloys cont...
In recent years the focused ion beam (FIB) technique has established itself as a capable and versati...
Grain boundaries of different misorientation and chemistry have differing susceptibilities to stress...
Atom Probe (AP) tomography is maturing into a routine method for the atomic resolution compositional...
Understanding crack propagation and initiation is fundamental if stress corrosion cracking (SCC) mec...
In this work is studied preparation of specimen for transmission electron microscope (TEM). Scanning...
The Transmission Electron Microscopy (TEM) increasingly is used to characterise the structure and mo...
Novel atom probe tomography (APT) data of an intergranular stress corrosion crack tip has been acqui...
Specimen preparation for Atom Probe Tomography is a demanding process particularly if the features o...
Focused ion beams (FIB) with beam diameters of well below 100 nm found wide application in local mat...
A site-specific technique for cross-section transmission electron microscopy specimen preparation of...
Commercially available focused ion beam (FIB) workstations with spatial resolution of 5-7 nm can pre...
The use of focused ion beam (FIB) milling for the preparation of transmission electron microscopy (T...
The preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and t...
The preparation of transmission electron microscope (TEM) thin foil specimens from metal alloys cont...
The preparation of transmission electron microscope (TEM) thin foil specimens from metal alloys cont...
In recent years the focused ion beam (FIB) technique has established itself as a capable and versati...
Grain boundaries of different misorientation and chemistry have differing susceptibilities to stress...
Atom Probe (AP) tomography is maturing into a routine method for the atomic resolution compositional...
Understanding crack propagation and initiation is fundamental if stress corrosion cracking (SCC) mec...
In this work is studied preparation of specimen for transmission electron microscope (TEM). Scanning...
The Transmission Electron Microscopy (TEM) increasingly is used to characterise the structure and mo...
Novel atom probe tomography (APT) data of an intergranular stress corrosion crack tip has been acqui...
Specimen preparation for Atom Probe Tomography is a demanding process particularly if the features o...
Focused ion beams (FIB) with beam diameters of well below 100 nm found wide application in local mat...
A site-specific technique for cross-section transmission electron microscopy specimen preparation of...
Commercially available focused ion beam (FIB) workstations with spatial resolution of 5-7 nm can pre...
The use of focused ion beam (FIB) milling for the preparation of transmission electron microscopy (T...