Annular dark-field STEM is shown to be extremely robust to the effects of chromatic aberration, allowing transfer to below 1 angstrom using underfocus to counteract the effects of spherical aberration. It is shown that the effect of chromatic focus spread is to impose an upper limit to the transfer function that is proportional to the reciprocal of spatial frequency, which is a much less severe truncation of information in reciprocal space than for conventional high-resolution TEM
A new simultaneous autofocus and twofold astigmatism correction method is proposed for High Angle An...
A new simultaneous autofocus and twofold astigmatism correction method is proposed for High Angle An...
In high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) the two-dime...
ORNL/CP-100163 Annular dark-field (ADF) imaging in a scanning transmission electron microscope (STEM...
Correction of spherical aberration (C-S) in the scanning transmission electron microscope (STEM) has...
A full coherent Bloch wave calculation is presented to investigate high-angle annular dark-field ima...
A full coherent Bloch wave calculation is presented to investigate high-angle annular dark-field ima...
Correction of spherical aberration (C-S) in the scanning transmission electron microscope (STEM) has...
Abstract A full coherent Bloch wave calculation is presented to investigate high-angle annular dark-...
Aberration correction has brought about a revolution in electron microscopy, with as much progress b...
As first pointed out by Lord Rayleigh a century ago, incoherent imaging offers a substantial resolut...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
A new simultaneous autofocus and twofold astigmatism correction method is proposed for High Angle An...
A new simultaneous autofocus and twofold astigmatism correction method is proposed for High Angle An...
A new simultaneous autofocus and twofold astigmatism correction method is proposed for High Angle An...
A new simultaneous autofocus and twofold astigmatism correction method is proposed for High Angle An...
In high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) the two-dime...
ORNL/CP-100163 Annular dark-field (ADF) imaging in a scanning transmission electron microscope (STEM...
Correction of spherical aberration (C-S) in the scanning transmission electron microscope (STEM) has...
A full coherent Bloch wave calculation is presented to investigate high-angle annular dark-field ima...
A full coherent Bloch wave calculation is presented to investigate high-angle annular dark-field ima...
Correction of spherical aberration (C-S) in the scanning transmission electron microscope (STEM) has...
Abstract A full coherent Bloch wave calculation is presented to investigate high-angle annular dark-...
Aberration correction has brought about a revolution in electron microscopy, with as much progress b...
As first pointed out by Lord Rayleigh a century ago, incoherent imaging offers a substantial resolut...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
A new simultaneous autofocus and twofold astigmatism correction method is proposed for High Angle An...
A new simultaneous autofocus and twofold astigmatism correction method is proposed for High Angle An...
A new simultaneous autofocus and twofold astigmatism correction method is proposed for High Angle An...
A new simultaneous autofocus and twofold astigmatism correction method is proposed for High Angle An...
In high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) the two-dime...