α particles emitted from an isotropic source and traversing a metallic foil of adequate thickness, produce on a collector an image of the foil. The image is shown to be due to channeled particles. The influence, on the contrast, of orientation, of grain (or twin) boundaries, stacking faults and dislocations is studied. Patterns are observed which are related to channeling in low index planes.Des particules α issues d'une source isotrope et traversant une feuille métallique d'épaisseur adéquate donnent sur un récepteur une image de la feuille. On montre que cette image est formée par des particules canalisées et l'on étudie l'influence de l'orientation, des joints de grains (ou de macles), des fautes d'empilement et des dislocations sur le c...
This paper demonstrates how images of crystal defects can be produced using ion channeling. A focuse...
Using the electron emission channeling and Rutherford backscattering/ channeling techniques, the inf...
The forward scattering geometry in the scanning electron microscope enables the acquisition of elect...
α particles emitted from an isotropic source and traversing a metallic foil of adequate thickness, p...
The channeling of heavy particles is disturbed by crystal defects and may even attain dechanneling. ...
This paper shows ion channeling images of the strain field produced by precipitate particles in a cr...
La technique Imagerie par Contraste de Canalisation d’Électrons (ECCI) est utilisée dans le Microsco...
Fine subgrains can be resolved on the electropolished specimen due to channelling contrast where the...
The technique of channeling scanning transmission ion microscopy (CSTIM) can be used to produce imag...
The influence of a stacking fault on planar channeling of charged particles is described. A channelo...
Thèse confidentielle jusqu'au 14 septembre 2021.Version abrégée en ligne.The Electron Channeling Con...
La technique Imagerie par Contraste de Canalisation d'Electron (ECCI) est utilisée en microscopie él...
High-contrast transmission channeling images and linescans of isolated bunches and individual 60° mi...
Bent crystals have demonstrated potential for use in beam collimation. A process called channeling i...
The Nuclear Microprobe at the University of Oxford has been employed to produce images of crystal de...
This paper demonstrates how images of crystal defects can be produced using ion channeling. A focuse...
Using the electron emission channeling and Rutherford backscattering/ channeling techniques, the inf...
The forward scattering geometry in the scanning electron microscope enables the acquisition of elect...
α particles emitted from an isotropic source and traversing a metallic foil of adequate thickness, p...
The channeling of heavy particles is disturbed by crystal defects and may even attain dechanneling. ...
This paper shows ion channeling images of the strain field produced by precipitate particles in a cr...
La technique Imagerie par Contraste de Canalisation d’Électrons (ECCI) est utilisée dans le Microsco...
Fine subgrains can be resolved on the electropolished specimen due to channelling contrast where the...
The technique of channeling scanning transmission ion microscopy (CSTIM) can be used to produce imag...
The influence of a stacking fault on planar channeling of charged particles is described. A channelo...
Thèse confidentielle jusqu'au 14 septembre 2021.Version abrégée en ligne.The Electron Channeling Con...
La technique Imagerie par Contraste de Canalisation d'Electron (ECCI) est utilisée en microscopie él...
High-contrast transmission channeling images and linescans of isolated bunches and individual 60° mi...
Bent crystals have demonstrated potential for use in beam collimation. A process called channeling i...
The Nuclear Microprobe at the University of Oxford has been employed to produce images of crystal de...
This paper demonstrates how images of crystal defects can be produced using ion channeling. A focuse...
Using the electron emission channeling and Rutherford backscattering/ channeling techniques, the inf...
The forward scattering geometry in the scanning electron microscope enables the acquisition of elect...