Add to ORKGIn this paper a modified architecture for at-speed scan testing is presented. This new architecture addresses the trend in the semiconductor industry for increased at-speed structural testing. The proposed architecture offers reduced time for standard at-speed testing, and, in particular, substantial savings for the repeated atspeed testing required for microprocessor speed and performance binning. The architecture has been demonstrated on UMC 0.18μm and has achieved with little die overhead
As manufacturing technology scales down to 65nm and below, fabricated chips are becoming increasingl...
With today’s design size in millions of gates and working frequency in gigahertz range, at-speed tes...
The quality of at-speed testing is being severely challenged by the problem that an inter-clock logi...
In this paper a modified architecture for at-speed scan testing is presented. This new architecture ...
Abstract – In this paper a modified architecture for at-speed scan testing is presented. This new ar...
This paper discusses the aspects and associated requirements of design and implementation of at-spee...
In this paper we will present an on-chip method for testing high performance memory devices, that oc...
As technology down scaling continues, new technical challenges emerge for the Integrated Circuits (I...
Abstract— With the remarkable scaling down of technology, test engineers are encountered with new ch...
Abstract — Process variations make at-speed testing sig-nificantly more difficult. They cause subtle...
[[abstract]]The advent of deep-submicron semiconductor technology makes system-on-chip (SOC) possibl...
The economic testing of high-speed digital ICs is becoming increasingly problematic. Even advanced, ...
With the growing complexity of today\u27s integrated circuit designs, engineers have abandoned the u...
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at ...
A test architecture for an SOC consists of a number of Test Access Mechanisms that connect to wrappe...
As manufacturing technology scales down to 65nm and below, fabricated chips are becoming increasingl...
With today’s design size in millions of gates and working frequency in gigahertz range, at-speed tes...
The quality of at-speed testing is being severely challenged by the problem that an inter-clock logi...
In this paper a modified architecture for at-speed scan testing is presented. This new architecture ...
Abstract – In this paper a modified architecture for at-speed scan testing is presented. This new ar...
This paper discusses the aspects and associated requirements of design and implementation of at-spee...
In this paper we will present an on-chip method for testing high performance memory devices, that oc...
As technology down scaling continues, new technical challenges emerge for the Integrated Circuits (I...
Abstract— With the remarkable scaling down of technology, test engineers are encountered with new ch...
Abstract — Process variations make at-speed testing sig-nificantly more difficult. They cause subtle...
[[abstract]]The advent of deep-submicron semiconductor technology makes system-on-chip (SOC) possibl...
The economic testing of high-speed digital ICs is becoming increasingly problematic. Even advanced, ...
With the growing complexity of today\u27s integrated circuit designs, engineers have abandoned the u...
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at ...
A test architecture for an SOC consists of a number of Test Access Mechanisms that connect to wrappe...
As manufacturing technology scales down to 65nm and below, fabricated chips are becoming increasingl...
With today’s design size in millions of gates and working frequency in gigahertz range, at-speed tes...
The quality of at-speed testing is being severely challenged by the problem that an inter-clock logi...