Scanning probe microscopes can probe a variety of quantities characterizing surfaces. This overview paper describes techniques applicable in an ambient environment and having the power to distinguish different materials: the scanning force and friction microscope and the scanning near-field optical microscope combined with a spectrometer. The basic operating principles of these two microscopes are described. Selected experiments point to possible future applications: we discuss scanning force and friction microscopy of ZnSe on GaAs and of Na, K-ATPase and near-field optical microscopy of a grating and of micropores
Presents several biological applications of near field optical microscopy, in combination with force...
This chapter presents the main principles of Scanning Electron Tunneling (STM) and atomic force micr...
Scanning probe techniques have evolved significantly in recent years to detect surface morphology of...
The family of scanning probe microscopes (SPMs) have revolutionary imaging capabilities on a range o...
Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been extended to a wide ...
Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been extended to a wide ...
A range of scanned probe techniques (SPM) are available today. The SPM's can work under various envi...
License and terms: see end of document. Since the invention of scanning tunnelling microscopy (STM) ...
Scanning probe microscopies (SPM) are a relatively new family of imaging techniques whose capabiliti...
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts...
We discuss recent developments in scanning probe microscopy aiming to combine ultra-high lateral res...
Recent developments in scanning probe microscopy (SPM) have widened the spectrum of possible investi...
In this paper, the possibility of studying both the atomic and electronic structures of a surface as...
DAMMER U, Anselmetti D, DREIER M, et al. Scanning Probe Microscopy for Industrial Applications: Sele...
The scanning probe microscopies (SPM) have transformed the way of studying the structure and the pro...
Presents several biological applications of near field optical microscopy, in combination with force...
This chapter presents the main principles of Scanning Electron Tunneling (STM) and atomic force micr...
Scanning probe techniques have evolved significantly in recent years to detect surface morphology of...
The family of scanning probe microscopes (SPMs) have revolutionary imaging capabilities on a range o...
Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been extended to a wide ...
Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been extended to a wide ...
A range of scanned probe techniques (SPM) are available today. The SPM's can work under various envi...
License and terms: see end of document. Since the invention of scanning tunnelling microscopy (STM) ...
Scanning probe microscopies (SPM) are a relatively new family of imaging techniques whose capabiliti...
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts...
We discuss recent developments in scanning probe microscopy aiming to combine ultra-high lateral res...
Recent developments in scanning probe microscopy (SPM) have widened the spectrum of possible investi...
In this paper, the possibility of studying both the atomic and electronic structures of a surface as...
DAMMER U, Anselmetti D, DREIER M, et al. Scanning Probe Microscopy for Industrial Applications: Sele...
The scanning probe microscopies (SPM) have transformed the way of studying the structure and the pro...
Presents several biological applications of near field optical microscopy, in combination with force...
This chapter presents the main principles of Scanning Electron Tunneling (STM) and atomic force micr...
Scanning probe techniques have evolved significantly in recent years to detect surface morphology of...