I. Comparison between the results obtained by David's method and the result one gets en considering a thin homogeneous and isotropic layer, the thickness d of which is small compared with the wavelength λ of the incident light. II. Study of the optical properties of thin (d « λ), inhomogeneous but isotropic films. It is supposed that their complex dielectric constant is a function of one coordinate only, the direction of which is normal to the film. Examination of the oblique incidence, the electric vector being perpendicular to the plane of incidence. Some simple relations between the reflexion and transmission coefficients and phase changes, are given. Discussion of the possibility of determining the characteristic parameters of a thin fi...
The application of the multiple angle and wavelength (MAW) technique to measure the dielectric funct...
A method is proposed for the determination of the complex refractive index of non-metallic thin film...
Although the optical behavior of rather thick transparent dielectric films on metal surfaces can be ...
By introducing the concept of impedance into Optics, the optical properties of thin films can be stu...
We calculate the complex refractive index of inhomogeneous thin films using the transfer matrix meth...
On développe une théorie générale, du deuxième ordre par rapport à l'épaisseur et à la rugosité supe...
This paper focuses on scattering phenomena resulting from isotropic microroughness as well as from c...
A sensitivity study is conducted on the polarimetric measurable [delta] = ([delta]p-[delta]s), the d...
The existing methods for determining the optical constants of inhomogeneous thin films deal with non...
The full expression for the minima of transmission and reflection spectra of a thin absorbing film a...
The contribution deals with a study of thin film layer properties prepared by material printing. Th...
Inverse optical problems are of major importance for many scientific and engineering projects. To na...
Polycrystalline, dielectric thin films are grown by the ultrahigh vacuum technique of molecular-beam...
Spectrophotometric methods : normal and oblique incidence. New rapid method for the measurement of t...
A method for determining the optical properties of a film on an isotropic substrate is proposed. The...
The application of the multiple angle and wavelength (MAW) technique to measure the dielectric funct...
A method is proposed for the determination of the complex refractive index of non-metallic thin film...
Although the optical behavior of rather thick transparent dielectric films on metal surfaces can be ...
By introducing the concept of impedance into Optics, the optical properties of thin films can be stu...
We calculate the complex refractive index of inhomogeneous thin films using the transfer matrix meth...
On développe une théorie générale, du deuxième ordre par rapport à l'épaisseur et à la rugosité supe...
This paper focuses on scattering phenomena resulting from isotropic microroughness as well as from c...
A sensitivity study is conducted on the polarimetric measurable [delta] = ([delta]p-[delta]s), the d...
The existing methods for determining the optical constants of inhomogeneous thin films deal with non...
The full expression for the minima of transmission and reflection spectra of a thin absorbing film a...
The contribution deals with a study of thin film layer properties prepared by material printing. Th...
Inverse optical problems are of major importance for many scientific and engineering projects. To na...
Polycrystalline, dielectric thin films are grown by the ultrahigh vacuum technique of molecular-beam...
Spectrophotometric methods : normal and oblique incidence. New rapid method for the measurement of t...
A method for determining the optical properties of a film on an isotropic substrate is proposed. The...
The application of the multiple angle and wavelength (MAW) technique to measure the dielectric funct...
A method is proposed for the determination of the complex refractive index of non-metallic thin film...
Although the optical behavior of rather thick transparent dielectric films on metal surfaces can be ...