Using band structure and total energy methods, we study the atomic and electronic structures of the polar (+c and $-c$ plane) and nonpolar (a and m plane) surfaces of GaN and InN. We identify two distinct microscopic origins for Fermi-level pinning on GaN and InN, depending on surface stoichiometry and surface polarity. At moderate Ga/N ratios unoccupied gallium dangling bonds pin the Fermi level on n-type GaN at 0.5–0.7$\un{eV}$ below the conduction-band minimum. Under highly Ga-rich conditions metallic Ga adlayers lead to Fermi-level pinning at 1.8$\un{eV}$ above the valence-band maximum. We also explain the source of the intrinsic electron accumulation that has been universally observed on polar InN surfaces. It is caused by In-In bonds ...
The electronic properties of clean InN(0001) surfaces have been investigated by high-resolution elec...
The composition dependence of the Fermi-level pinning at the oxidized (0001) surfaces of n-type InxG...
We present a cross-section scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS...
We report a systematic and comprehensive computational study of the electronic structure of GaN and ...
GaN1000 cleavage surfaces were investigated by cross-sectional scanning tunneling microscopy and spe...
We illustrate a polarity-dependent Fermi level pinning at semiconductor surfaces with chargeable sur...
InN/GaN heterostructure was fabricated via reactive low energetic Nitrogen ion (LENI at 300 eV) bomb...
The electronic properties of a-plane and m-plane InN have been investigated by x-ray photoemission s...
GaN(11¯00) cleavage surfaces were investigated by cross-sectional scanning tunneling microscopy and ...
The electron affinity and surface states are of utmost importance for designing the potential landsc...
We present a cross-section scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS...
Electron accumulation at the oxidized surface of In- and N-polarity indium nitride is shown to exhib...
abstract: GaN-based devices are currently limited by reliability issues such as gate leakage and cur...
The surfaces of In- and N-polarity InN grown by molecular-beam epitaxy have been investigated using ...
We investigate the electronic structure of the GaN (10 1 ̄ 0) prototype surface for GaN nanowire sid...
The electronic properties of clean InN(0001) surfaces have been investigated by high-resolution elec...
The composition dependence of the Fermi-level pinning at the oxidized (0001) surfaces of n-type InxG...
We present a cross-section scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS...
We report a systematic and comprehensive computational study of the electronic structure of GaN and ...
GaN1000 cleavage surfaces were investigated by cross-sectional scanning tunneling microscopy and spe...
We illustrate a polarity-dependent Fermi level pinning at semiconductor surfaces with chargeable sur...
InN/GaN heterostructure was fabricated via reactive low energetic Nitrogen ion (LENI at 300 eV) bomb...
The electronic properties of a-plane and m-plane InN have been investigated by x-ray photoemission s...
GaN(11¯00) cleavage surfaces were investigated by cross-sectional scanning tunneling microscopy and ...
The electron affinity and surface states are of utmost importance for designing the potential landsc...
We present a cross-section scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS...
Electron accumulation at the oxidized surface of In- and N-polarity indium nitride is shown to exhib...
abstract: GaN-based devices are currently limited by reliability issues such as gate leakage and cur...
The surfaces of In- and N-polarity InN grown by molecular-beam epitaxy have been investigated using ...
We investigate the electronic structure of the GaN (10 1 ̄ 0) prototype surface for GaN nanowire sid...
The electronic properties of clean InN(0001) surfaces have been investigated by high-resolution elec...
The composition dependence of the Fermi-level pinning at the oxidized (0001) surfaces of n-type InxG...
We present a cross-section scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS...