Dynamic response of electronic systems to shocks and vibrations: Application of analytical (mathematical) modeling

Some basic problems of the dynamic response of electronic and photonic (E&P) systems to shocks and vibrations are addressed and discussed. The emphasis is on analytical (mathematical) modeling, the reliability physics behind the addressed phenomena, and design-for-reliability (DfR) issues and challenges. The addressed problems include 1) linear response: effect of viscous damping, shock tests vs. drop tests, role of compliant interfaces, and maximum acceleration and maximum dynamic stress as a suitable reliability criterion; 2) nonlinear response: printed circuit board (PCB) experiencing an impact load applied to its support contour and ball-grid-array (BGA) testing on the board level; 3) shock protection of portable electronics, including the possible use of nano-wires as a suitable protective “cushion”. The fruitfulness of the probabilistic DfR (PDfR) concept to quantify and assure the field (operational) reliability of E&P devices and systems is also indicated