We explore theoretically the interference of white light between two interfaces as a function of the optical conditions, using separately: a) idealised conditions where the light is composed of three discrete wavelengths; b) a more typically experimentally realisable case where light comprises a sum of three Gaussian wavelength distributions; and c) unfiltered white light from a broadband source comprising a broad distribution of wavelengths. It is demonstrated that the latter case is not only optically simple to arrange, but also provides unambiguous absolute separation information over the range 0-1μm --a useful range in studies of cell adhesion, thin liquid films and lubrication-- when coupled to detection using a typical colour camera. ...
Spectrally resolved white-light phase-shifting interferometry has been used for accurate measurement...
Copyright © 2018 American Chemical Society. Film thickness measurement of unstable thin liquid films...
An important factor in the success of the surface force apparatus (SFA) in measuring interactions be...
Determining lubricant film thickness between contacting bodies under elastohydrodynamic (EHD) condit...
The effects of the presence of a transparent thin film on a test surface in white-light interferomet...
Spectrally resolved white-light phase-shifting interference microscopy can be used for rapid and acc...
International audienceIn the domain of optical metrology, white light interference microscopy is mai...
International audienceFor a long time, obtaining the optical and morphological properties of a trans...
Visualizing and measuring thin-film thickness at the nanoscale during dynamic evolution has been an ...
The paper shows the development of a photometric technique for mapping the thickness of liquid films...
When a liquid droplet impacts on a solid surface, it not only deforms substantially but also an air ...
In recent years it has been observed that the thickness of a polymer film deposited on glass substra...
Single wavelength interferometry is a useful tool in the area of optical profilometry given its high...
Methods for determining the substrate properties and the optical thickness of thin films or any vari...
2009 international conference on optical instruments and technology : optoelectronic measurement tec...
Spectrally resolved white-light phase-shifting interferometry has been used for accurate measurement...
Copyright © 2018 American Chemical Society. Film thickness measurement of unstable thin liquid films...
An important factor in the success of the surface force apparatus (SFA) in measuring interactions be...
Determining lubricant film thickness between contacting bodies under elastohydrodynamic (EHD) condit...
The effects of the presence of a transparent thin film on a test surface in white-light interferomet...
Spectrally resolved white-light phase-shifting interference microscopy can be used for rapid and acc...
International audienceIn the domain of optical metrology, white light interference microscopy is mai...
International audienceFor a long time, obtaining the optical and morphological properties of a trans...
Visualizing and measuring thin-film thickness at the nanoscale during dynamic evolution has been an ...
The paper shows the development of a photometric technique for mapping the thickness of liquid films...
When a liquid droplet impacts on a solid surface, it not only deforms substantially but also an air ...
In recent years it has been observed that the thickness of a polymer film deposited on glass substra...
Single wavelength interferometry is a useful tool in the area of optical profilometry given its high...
Methods for determining the substrate properties and the optical thickness of thin films or any vari...
2009 international conference on optical instruments and technology : optoelectronic measurement tec...
Spectrally resolved white-light phase-shifting interferometry has been used for accurate measurement...
Copyright © 2018 American Chemical Society. Film thickness measurement of unstable thin liquid films...
An important factor in the success of the surface force apparatus (SFA) in measuring interactions be...