Structural deformation, melting point and lattice parameter studies of size selected silver clusters

Silver clusters have been produced by magnetron sputtering in a gas aggregation nanocluster source. Clusters are size selected using a quadrupole mass filter (3–8 nm) or by varying the aggregation tube length (9–20 nm) of the nanocluster source. Mass selected clusters are deposited on a Si(100) substrate at different bias voltages and are characterized by atomic force microscopy. We observe a significant flattening of clusters on the surface due to the increase of impact energy as a result of increasing substrate bias voltage. The behavior of lattice parameters for size selected clusters are investigated by X-ray diffraction. All measured lattice constants exhibit a tensile strain; it is found that the lattice constant slightly increases with increasing cluster size up to a size of 12 nm and then decreases. The melting temperature of deposited clusters is found to be size-dependent and significantly lower than for bulk material, in agreement with theoretical considerations