The distribution of return intervals of extreme events is studied in time series characterized by finite-term correlations with non-exponential decay. Precisely, it has been analyzed the statistics of the return intervals of extreme values of the resistance fluctuations displayed by resistors with granular structure in nonequilibrium stationary states. The resistance fluctuations are calculated by Monte Carlo simulations using a resistor network approach. It has been found that for highly disordered networks, when the auto-correlation function displays a non-exponential and non-power-law decay, the distribution of return intervals of the extreme values is a stretched exponential, with exponent independent of the threshold
The probability densities of the mean recurrence time, which is the average time needed for a system...
We consider the critical properties of the two-point resistance and its fluctuations due to microsco...
Abstract. The distribution of extreme event return times and their correlations are analyzed in obse...
The distribution of return intervals of extreme events is studied in time series characterized by fi...
We study the effect on the distribution of return periods of rare events of the presence in a time s...
It will be discussed the statistics of the extreme values in time series characterized by finite-ter...
We study the distribution of the resistance fluctuations of biased resistor networks in nonequilibri...
In a random resistor network we consider the simultaneous evolution of two competing random processe...
Abstract—We review recent studies of the statistics of return intervals (i) in long-term correlated ...
We study the distribution of resistance fluctuations of conducting thin films with different levels ...
The distribution of extreme event return times and their correlations are analyzed in observed and s...
The exact distribution of extremes of a non-gaussian stationary discrete process is obtained and the...
We consider a two-dimensional random resistor network (RRN) in the presence of two competing biased ...
Time-averaged autocorrelation functions of a dichotomous random process switching between 1 and 0 an...
Recently we have developed a new statistical approach which allows the study of the electrical noise...
The probability densities of the mean recurrence time, which is the average time needed for a system...
We consider the critical properties of the two-point resistance and its fluctuations due to microsco...
Abstract. The distribution of extreme event return times and their correlations are analyzed in obse...
The distribution of return intervals of extreme events is studied in time series characterized by fi...
We study the effect on the distribution of return periods of rare events of the presence in a time s...
It will be discussed the statistics of the extreme values in time series characterized by finite-ter...
We study the distribution of the resistance fluctuations of biased resistor networks in nonequilibri...
In a random resistor network we consider the simultaneous evolution of two competing random processe...
Abstract—We review recent studies of the statistics of return intervals (i) in long-term correlated ...
We study the distribution of resistance fluctuations of conducting thin films with different levels ...
The distribution of extreme event return times and their correlations are analyzed in observed and s...
The exact distribution of extremes of a non-gaussian stationary discrete process is obtained and the...
We consider a two-dimensional random resistor network (RRN) in the presence of two competing biased ...
Time-averaged autocorrelation functions of a dichotomous random process switching between 1 and 0 an...
Recently we have developed a new statistical approach which allows the study of the electrical noise...
The probability densities of the mean recurrence time, which is the average time needed for a system...
We consider the critical properties of the two-point resistance and its fluctuations due to microsco...
Abstract. The distribution of extreme event return times and their correlations are analyzed in obse...