A specific experimental Laser Scattering Tomography (LST) acquisition procedure is presented. It is adapted to the characterization of materials containing scattering defects ranging from 1 to 102/mm3. The technique makes it possible to obtain good resolution within a volume chosen to contain a statistically significant defect density. This method is used to show that the gas levitation technique makes it possible to significantly decrease scattering defects in glasses. In parallel, individual study of defects in such glasses is also presented
Parmi les différentes méthodes de caractérisation des défauts dans les wafers de semiconducteur, les...
Light scattering is one of the loss mechanisms of optical components. It is caused by intrinsic and ...
It is known that surface and subsurface defects in ceramic components may significantly affect compo...
A specific experimental Laser Scattering Tomography (LST) acquisition procedure is presented. It is ...
International audienceA specific experimental Laser Scattering Tomography (LST) acquisition procedur...
The goal of this research is to explore the application of the non-destructive technique of Laser Sc...
Laser modulated scattering (LMS) is introduced as a non-destructive evaluation tool for defect inspe...
This paper presents a simple alternative for the analysis and evaluation of ultrasonic scattering fr...
The main aim of this experimentation is the evaluation of potentialities of terrestrial laser scanne...
The microtopography of a certain surface is a complicated structure varying across the complete surf...
This work describes the system for the light scattering measurements in a wide spectral range, which...
Laser-induced damage of optical surfaces, thin film coatings, and materials is greatly influenced by...
Glass ceramic materials have been suggested as a possible high resolution replacement for current co...
Glass ceramic materials have been suggested as a possible high resolution replacement for current co...
Defects in several compound semiconducting single crystals are evaluated by using the light scatteri...
Parmi les différentes méthodes de caractérisation des défauts dans les wafers de semiconducteur, les...
Light scattering is one of the loss mechanisms of optical components. It is caused by intrinsic and ...
It is known that surface and subsurface defects in ceramic components may significantly affect compo...
A specific experimental Laser Scattering Tomography (LST) acquisition procedure is presented. It is ...
International audienceA specific experimental Laser Scattering Tomography (LST) acquisition procedur...
The goal of this research is to explore the application of the non-destructive technique of Laser Sc...
Laser modulated scattering (LMS) is introduced as a non-destructive evaluation tool for defect inspe...
This paper presents a simple alternative for the analysis and evaluation of ultrasonic scattering fr...
The main aim of this experimentation is the evaluation of potentialities of terrestrial laser scanne...
The microtopography of a certain surface is a complicated structure varying across the complete surf...
This work describes the system for the light scattering measurements in a wide spectral range, which...
Laser-induced damage of optical surfaces, thin film coatings, and materials is greatly influenced by...
Glass ceramic materials have been suggested as a possible high resolution replacement for current co...
Glass ceramic materials have been suggested as a possible high resolution replacement for current co...
Defects in several compound semiconducting single crystals are evaluated by using the light scatteri...
Parmi les différentes méthodes de caractérisation des défauts dans les wafers de semiconducteur, les...
Light scattering is one of the loss mechanisms of optical components. It is caused by intrinsic and ...
It is known that surface and subsurface defects in ceramic components may significantly affect compo...