Under near threshold conditions fatigue cracks often propagate along crystallographic slip planes with a marked mode II contribution to the loading, particularly when the crack is short. We present here a model for this stage I fatigue crack in which a mode II crack generates dislocations either through activation of a source ahead of the crack or through direct emission from the tip, and the motion and interaction of these dislocations are then simulated dynamically throughout the load-unload cycle. The crack is assumed to grow when cyclic displacement occurs at the crack tip, so that the condition that at least one emitted dislocation per cycle must return to the crack tip, allows the threshold cyclic stress intensity (ΔKth) to be calcula...