After a short reminding on the use of photoextensometric coatings, the author describes and discusses the measuring method of the double refraction based on the utilization of a multiplier phototube as a detector for the polarizing microscope fitted with a monochromatic circularly polarized light. This method is based on a non-linear characteristic and furthermore makes necessary a rigourous stabilization of the microscope illuminator and of the photomultiplier supply. The author suggests a new measuring method using a rotating analyzer by which those instability causes are eliminated. The dynamic and static field can be investigated with this apparatus ; in the dynamic field the method is only limited by the rotation speed of the analyzer....
The polarized light scattered by the surface of a material contains information that can be used to ...
Adaptive optics (AO) is a powerful tool for microscopy. It helps to improve the image qualityand res...
Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Any: 2014, Tutor: O...
The measuring method has the light provided by a light source (1) passed through a rotating polarise...
A complete and punctual Stokes polarimeter based on the conical refraction (CR) phenomenon is presen...
Polarimetry problems can be dealt with simply the help of Poincaré's representation ; as this method...
L'étude concerne la mise en œuvre du processus de polarisation tout-optique en vue de l'orientation ...
The methods which are capable of making rapid (short-period) measurements of large path differences ...
A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in bi...
In this paper we describe a new Mueller matrix (MM) microscope that generalizes and makes quantitati...
An apparatus for measuring linear dichroism in the vacuum ultraviolet by modulating the polarisation...
An ellipsometer based on an elasto optic modulation of polarization has been developed. Compare to a...
Refractive index (RI) is an essential parameter of transparent fluids, used to characterize purity, ...
A simple non-destructive method of measuring the refractive index and thickness of transparent films...
La stabilité optique nonlinéaire du colorant (Disperse red 1) dopé dans différent polymères amorphes...
The polarized light scattered by the surface of a material contains information that can be used to ...
Adaptive optics (AO) is a powerful tool for microscopy. It helps to improve the image qualityand res...
Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Any: 2014, Tutor: O...
The measuring method has the light provided by a light source (1) passed through a rotating polarise...
A complete and punctual Stokes polarimeter based on the conical refraction (CR) phenomenon is presen...
Polarimetry problems can be dealt with simply the help of Poincaré's representation ; as this method...
L'étude concerne la mise en œuvre du processus de polarisation tout-optique en vue de l'orientation ...
The methods which are capable of making rapid (short-period) measurements of large path differences ...
A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in bi...
In this paper we describe a new Mueller matrix (MM) microscope that generalizes and makes quantitati...
An apparatus for measuring linear dichroism in the vacuum ultraviolet by modulating the polarisation...
An ellipsometer based on an elasto optic modulation of polarization has been developed. Compare to a...
Refractive index (RI) is an essential parameter of transparent fluids, used to characterize purity, ...
A simple non-destructive method of measuring the refractive index and thickness of transparent films...
La stabilité optique nonlinéaire du colorant (Disperse red 1) dopé dans différent polymères amorphes...
The polarized light scattered by the surface of a material contains information that can be used to ...
Adaptive optics (AO) is a powerful tool for microscopy. It helps to improve the image qualityand res...
Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Any: 2014, Tutor: O...