With the progressive scaling of the modern CMOS processes arising during the recent years, for the devices operating in space the susceptivity to the over-voltage events has increased. They have become more stringent the requirements in terms of accuracy of the supply voltage worth their reliability. For the case of CMOS memories operating at 1.5V it is essential to guarantee a variation of the nominal VOUT to within 5% including those arising on the supply voltage during the transients. Finally, for a voltage regulator operating in space one of the most salient effects are the voltage transients induced on the output by the single events (SET) that may exceed the aforementioned 5% threshold. This can be cause of damage into the circuitry f...
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. ...
Abstract — We present a novel design technique for harden-ing digital electronic circuits against To...
In this paper, we discuss the diagnosis of particle-induced failures in harsh environments such as s...
Down-scaling of the supply voltage is considered as the most effective means of reducing the power- ...
Two new types of electronic cards have been tested in CERN's CHARM irradiation facility. The cards a...
This paper presents a fast-transient radiation-hardened low-dropout (LDO) voltage regulator integrat...
Presently a major concern about electronic devices operating in space environment is the radiation e...
Radiation in space is potentially hazardous to microelectronic circuits and systems such as spacecra...
%title\\ \\In the recent years, intensive work has been carried out on the development of custom ICs...
The aim of this paper was to test the possibility of implementation of the commercial-off-the-shelf ...
Radiation from terrestrial and space environments is a great danger to integrated circuits (ICs). A ...
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. ...
Examinations of the minimum dropout voltage with a high load current demonstrated proper operation o...
Integrated Circuits in space suffer from reliability problems due to the radiative surroundings. Hig...
A low-power, wide temperature range, radiation tolerant CMOS voltage reference is presented. The pro...
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. ...
Abstract — We present a novel design technique for harden-ing digital electronic circuits against To...
In this paper, we discuss the diagnosis of particle-induced failures in harsh environments such as s...
Down-scaling of the supply voltage is considered as the most effective means of reducing the power- ...
Two new types of electronic cards have been tested in CERN's CHARM irradiation facility. The cards a...
This paper presents a fast-transient radiation-hardened low-dropout (LDO) voltage regulator integrat...
Presently a major concern about electronic devices operating in space environment is the radiation e...
Radiation in space is potentially hazardous to microelectronic circuits and systems such as spacecra...
%title\\ \\In the recent years, intensive work has been carried out on the development of custom ICs...
The aim of this paper was to test the possibility of implementation of the commercial-off-the-shelf ...
Radiation from terrestrial and space environments is a great danger to integrated circuits (ICs). A ...
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. ...
Examinations of the minimum dropout voltage with a high load current demonstrated proper operation o...
Integrated Circuits in space suffer from reliability problems due to the radiative surroundings. Hig...
A low-power, wide temperature range, radiation tolerant CMOS voltage reference is presented. The pro...
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. ...
Abstract — We present a novel design technique for harden-ing digital electronic circuits against To...
In this paper, we discuss the diagnosis of particle-induced failures in harsh environments such as s...