Dislocation images in the high resolution scanning electron microscope with conventional filament have been obtained in transmission and back scattering modes from thin molybdenite crystals. Thick crystals show overwhelming topology contrast from surface steps and imperfections.Des images de dislocations dans des échantillons minces de molybdénite ont été obtenues avec un microscope électronique à balayage, équipé d'un filament conventionnel, suivant les deux modes : électrons transmis, électrons rétrodiffusés. Sur des cristaux épais on n'observe par contre que le contraste des marches et autres imperfections superficielles
Les études des défauts cristallins, spécialement des dislocations situées près des jonctions p-n for...
Of the methods used in the study of defects in crystals employing diffraction contrast, transmission...
The lattice distorsions induced by the dislocations decrease the contrast and widen the channelling ...
Dislocation images in the high resolution scanning electron microscope with conventional filament ha...
We describe the use of electron channeling contrast imaging in the scanning electron microscope to r...
We describe the use of electron channeling contrast imaging in the scanning electron microscope to r...
Dislocations and stacking faults are observed in Scanning Electron Microscopy in transmission or ref...
We present an application of scanning electron diffraction for the characterisation of crystal defec...
High-resolution electron microscope images were simulated for two structural models of Si crystal co...
Les dislocations d'interfaces qui se produisent après épitaxie ou diffusion dans les semiconducteurs...
This paper presents annular dark-field scanning transmission electron microscope image simulations o...
High-resolution scanning transmission electron microscopy (STEM) has been used to study the structur...
The interpretation of electron micrographs becomes easier after filtering of the photographic and el...
Le coeur des dislocations primaires d'un joint de flexion dans du molybdène a été étudié par microsc...
Dislocations in crystalline materials have a strong impact on mechanical properties. As a result, id...
Les études des défauts cristallins, spécialement des dislocations situées près des jonctions p-n for...
Of the methods used in the study of defects in crystals employing diffraction contrast, transmission...
The lattice distorsions induced by the dislocations decrease the contrast and widen the channelling ...
Dislocation images in the high resolution scanning electron microscope with conventional filament ha...
We describe the use of electron channeling contrast imaging in the scanning electron microscope to r...
We describe the use of electron channeling contrast imaging in the scanning electron microscope to r...
Dislocations and stacking faults are observed in Scanning Electron Microscopy in transmission or ref...
We present an application of scanning electron diffraction for the characterisation of crystal defec...
High-resolution electron microscope images were simulated for two structural models of Si crystal co...
Les dislocations d'interfaces qui se produisent après épitaxie ou diffusion dans les semiconducteurs...
This paper presents annular dark-field scanning transmission electron microscope image simulations o...
High-resolution scanning transmission electron microscopy (STEM) has been used to study the structur...
The interpretation of electron micrographs becomes easier after filtering of the photographic and el...
Le coeur des dislocations primaires d'un joint de flexion dans du molybdène a été étudié par microsc...
Dislocations in crystalline materials have a strong impact on mechanical properties. As a result, id...
Les études des défauts cristallins, spécialement des dislocations situées près des jonctions p-n for...
Of the methods used in the study of defects in crystals employing diffraction contrast, transmission...
The lattice distorsions induced by the dislocations decrease the contrast and widen the channelling ...