The effect of nitrogen on the valence-electron plasmon energy in amorphous carbon-nitrogen alloys (a-C1-xNx) is used to identify structural changes in the material. The samples were prepared by dual-ion-beam-assisted deposition and studied in situ by x-ray photoemission spectroscopy. The plasmon energy of the alloy goes through a maximum above 15-20 at.% nitrogen concentration. This behavior is correlated with structural changes obtained in a semiempirical quantum chemical calculation on graphite-like carbon clusters, randomly substituted by nitrogen. At that concentration, the geometry optimization shows that the graphite-like conformation is unstable against the buckling of the structure. (C) 1998 American Institute of Physics. [S0003-695...
The isotopic effect on the infrared spectra is used to determine the existence of nitrogen-hydrogen ...
Carbon nitride films, deposited by reactive dc magnetron sputtering in Ar/N2 discharges, were studie...
AES, XPS and SIMS surface analysis techniques were used in the study of the amorphous carbon nitride...
The electronic structure of nitrogen-containing diamondlike films prepared by sputtering was determi...
The effects of nitrogen incorporation on the atomic-scale structure of amorphous CNx samples have be...
The effect of hydrogen on the electronic structure of amorphous carbon-nitrogen alloys (a-CNx) prepa...
Amorphous CNx and CNx:H have been prepared by the ion beam assisted deposition technique. Samples we...
A study of ultraviolet and visible Raman spectroscopy was made in amorphous carbon nitride (a-C:Nx) ...
Nitrogen can have numerous effects on diamond-like carbon: it can dope, it can form the hypothetical...
In this study, we investigate the effect of the inclusion of nitrogen in amorphous carbon thin films...
In this program, we developed new theoretical and experimental insights into understanding the relat...
The Ge 3d core levels of sub-stoichiometric amorphous germanium-nitrogen (a-GeN) alloys are studied ...
The effect of substrate bias on X-ray photoelectron spectroscopy (XPS) study of nitrogen incorporate...
Amorphous carbon nitride films (a-CN x) with nitrogen concentration ranging from 0 to 30 at.% were p...
Amorphous carbon nitride (a-C:N) films were deposited by reactive direct current magnetron sputterin...
The isotopic effect on the infrared spectra is used to determine the existence of nitrogen-hydrogen ...
Carbon nitride films, deposited by reactive dc magnetron sputtering in Ar/N2 discharges, were studie...
AES, XPS and SIMS surface analysis techniques were used in the study of the amorphous carbon nitride...
The electronic structure of nitrogen-containing diamondlike films prepared by sputtering was determi...
The effects of nitrogen incorporation on the atomic-scale structure of amorphous CNx samples have be...
The effect of hydrogen on the electronic structure of amorphous carbon-nitrogen alloys (a-CNx) prepa...
Amorphous CNx and CNx:H have been prepared by the ion beam assisted deposition technique. Samples we...
A study of ultraviolet and visible Raman spectroscopy was made in amorphous carbon nitride (a-C:Nx) ...
Nitrogen can have numerous effects on diamond-like carbon: it can dope, it can form the hypothetical...
In this study, we investigate the effect of the inclusion of nitrogen in amorphous carbon thin films...
In this program, we developed new theoretical and experimental insights into understanding the relat...
The Ge 3d core levels of sub-stoichiometric amorphous germanium-nitrogen (a-GeN) alloys are studied ...
The effect of substrate bias on X-ray photoelectron spectroscopy (XPS) study of nitrogen incorporate...
Amorphous carbon nitride films (a-CN x) with nitrogen concentration ranging from 0 to 30 at.% were p...
Amorphous carbon nitride (a-C:N) films were deposited by reactive direct current magnetron sputterin...
The isotopic effect on the infrared spectra is used to determine the existence of nitrogen-hydrogen ...
Carbon nitride films, deposited by reactive dc magnetron sputtering in Ar/N2 discharges, were studie...
AES, XPS and SIMS surface analysis techniques were used in the study of the amorphous carbon nitride...