A novel approach to normalize Compton profiles of pure incoherent scatterers

In this paper we show that the effective atomic number of amorphous materials which can be treated as pure incoherent scatterers can itself be used as a constant for normalizing the experimental Compton profiles. This finding is expected to be useful since calculation of the normalization constant by the usual procedure of integrating the Biggs et al. Compton profile values is a tedious task for composite materials. This method is applicable to pure incoherent scatterers of known as well as unknown composition