Thermal evolution of magnetic properties of thin films having perpendicular anisotropy

In this work we report on the temperature evolution (10K-470K) of the magnetization processes of amorphous FexSi1-x thin films having perpendicular anisotropy. The film thickness was close to 100 nm. Hysteresis loops show the estinction of stripe domains at a critical temperature of Tc = 250K. In order to analyze possible changes in anisotropies (perpendicular and in-plane) throughout the film thickness, we compare bulk properties measured by Alternating Gradient Magnetometer (AGM) with results obtained from MOKE at both film interfaces