DOIAbstract
Thin films of lead titanate (PbTiO3-PT) have been prepared in-situ on SrTiO3 (100) substrates using radio-frequency sputtering. The epitaxial quality of the films has been investigated as a function of the substrate temperature. Stoichiometric films have been obtained in the temperature range 550°C-600°C. Films have a high degree of c-axis oriented crystalline structure. The optimum conditions for growing epitaxial PbTiO3 layers are reported in this study. Thin films grown at 550°C exhibited a rocking curve full width at a half maximum (FWHM) of 0.26°. The refractive index calculated from optical transmission method has been evaluated to 2.61 @ 632.8nm, which represents 98% of the corresponding bulk material
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