Time resolved ellipsometry is applied to investigate heat diffusion processes occurring in polymer coated silicon under pulsed excitation. Experimental results, modelisation and analysis are presented
International audienceWe investigate the evolution over time of the space profiles of precursor film...
The properties of a thin polymer film can be significantly affected by the presence of a penetrant. ...
We present an ellipsometric technique and ellipsometric analysis of repetitive phenomena, based on t...
Time resolved ellipsometry is applied to investigate heat diffusion processes occurring in polymer c...
In-situ Spectroscopic Ellipsometry is used to study diffusion of liquid n-hexane in silicon wafer su...
Thin and ultra-thin (<100 nm) polymer films are frequently used in important technological areas, in...
Long-term objective is to determine heat transfer and stability of evaporating ultra-thin films, som...
Transient thermal gratings have been utilized for investigating heat diffusion in thin films. The gr...
In situ time-resolved spectroscopic ellipsometry is used to study the dynamics of n-hexane diffusion...
Ellipsometry is an optical technique where the polarisation of light beam reflected by a sample is a...
A new application of infrared ellipsometry is reported. Specifically, the interdiffusion between thi...
AbstractThis paper describes the development of an experimental technique that combines simultaneous...
A novel method for thermal diffusivity evolution of thin-film materials with pulsed Gaussian beam an...
We have used ellipsometry to measure the initial stages of interface healing in bilayer polystyrene ...
International audienceThis paper reports the ultra-fast transient hot-strip (THS) technique for dete...
International audienceWe investigate the evolution over time of the space profiles of precursor film...
The properties of a thin polymer film can be significantly affected by the presence of a penetrant. ...
We present an ellipsometric technique and ellipsometric analysis of repetitive phenomena, based on t...
Time resolved ellipsometry is applied to investigate heat diffusion processes occurring in polymer c...
In-situ Spectroscopic Ellipsometry is used to study diffusion of liquid n-hexane in silicon wafer su...
Thin and ultra-thin (<100 nm) polymer films are frequently used in important technological areas, in...
Long-term objective is to determine heat transfer and stability of evaporating ultra-thin films, som...
Transient thermal gratings have been utilized for investigating heat diffusion in thin films. The gr...
In situ time-resolved spectroscopic ellipsometry is used to study the dynamics of n-hexane diffusion...
Ellipsometry is an optical technique where the polarisation of light beam reflected by a sample is a...
A new application of infrared ellipsometry is reported. Specifically, the interdiffusion between thi...
AbstractThis paper describes the development of an experimental technique that combines simultaneous...
A novel method for thermal diffusivity evolution of thin-film materials with pulsed Gaussian beam an...
We have used ellipsometry to measure the initial stages of interface healing in bilayer polystyrene ...
International audienceThis paper reports the ultra-fast transient hot-strip (THS) technique for dete...
International audienceWe investigate the evolution over time of the space profiles of precursor film...
The properties of a thin polymer film can be significantly affected by the presence of a penetrant. ...
We present an ellipsometric technique and ellipsometric analysis of repetitive phenomena, based on t...
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