FINE STRUCTURE IN EELS FROM RARE EARTH SESQUIOXIDE THIN FILMS

Chemical and structural characterization of periodic metal/oxide nanometric layers using STEM-EELS

Potin, Valérie
Cacucci, Arnaud
Imhoff, Luc
Martin, Nicolas

January 2013

POSTER - International Electron Energy Loss Spectroscopy Meeting - EDGE 2013, Saint-Maxime, 26 - 31 ...

Chemical and structural characterization of periodic metal/oxide nanometric layers using STEM-EELS

Potin, Valérie
Cacucci, Arnaud
Imhoff, Luc
Martin, Nicolas

January 2013

POSTER - International Electron Energy Loss Spectroscopy Meeting - EDGE 2013, Saint-Maxime, 26 - 31 ...

Chemical and structural characterization of periodic metal/oxide nanometric layers using STEM-EELS

Potin, Valérie
Cacucci, Arnaud
Imhoff, Luc
Martin, Nicolas

January 2013

POSTER - International Electron Energy Loss Spectroscopy Meeting - EDGE 2013, Saint-Maxime, 26 - 31 ...

FINE STRUCTURE IN EELS FROM RARE EARTH SESQUIOXIDE THIN FILMS

L.M. Brown
C. Colliex
M. Gasgnier

January 1984

Les structures fines des seuils d'absorption entre 0 et 2 keV des sesquioxydes de terres rares à l'é...

FINE STRUCTURE IN EELS FROM RARE EARTH SESQUIOXIDE THIN FILMS

L.M. Brown
C. Colliex
M. Gasgnier

January 1984

Les structures fines des seuils d'absorption entre 0 et 2 keV des sesquioxydes de terres rares à l'é...

Element and phase identification via fine structure analysis in EELS: application to MOCVD-Y1Ba2Cu3O7-delta thin films

Grigis, C
Schamm-Chardon, Sylvie

January 1998

International audienceElectron energy loss spectroscopy (EELS) in the transmission electron microsco...

Element and phase identification via fine structure analysis in EELS: application to MOCVD-Y1Ba2Cu3O7-delta thin films

Grigis, C
Schamm-Chardon, Sylvie

January 1998

International audienceElectron energy loss spectroscopy (EELS) in the transmission electron microsco...

Edge effect in the ELNES of Co oxide absorption edges

Zaoli Zhang
Wilfried Sigle
Manfred Rühle

July 2015

EELS probes the unoccupied density of states above the Fermi level. The analysis of the energy-loss ...

Detecting Structural and Bonding Changes in EELS Near-Edge Structures with a Monochromated TEM

G. A. Botton
M. -y. Wu
C. Maunders
J. Etheridge
H. J. Whitfield

October 2016

The enhanced energy resolution in electron energy loss spectroscopy measurements achieved in transmi...

Structural study of thin films by extended energyloss fine structure spectroscopy

De Crescenzi, M.
Motta, N.
Lozzi, L.
Passacantando, M.
Picozzi, P.
Santucci, S.

January 1990

The extended energy loss fine-structure (EELFS) technique, using low kineticenergy electrons in the ...

Spatially Resolved EELS Fine Structures at a $\bf SiO_2/TiO_2$ Interface

Nathalie Brun
Christian Colliex
Josette Rivory
Yu-Zhang Kui

January 1996

$\rm SiO_2/TiO_2$ multilayers stacks used in optical coatings have been studied by Electron Energy L...

EELS at very high energy losses

MacLaren, Ian
Annand, Kirsty J.
Black, Colin
Craven, Alan J.

March 2018

Electron energy-loss spectroscopy (EELS) has been investigated in the range from 2 to >10 keV us...

Atomically resolved mapping of EELS fine structures

Gloter, Alexandre
Badjeck, Vincent
Bocher, Laura
Brun, Nathalie
March, Katia
Marinova, Maya
Tencé, Marcel
Walls, Michael
Zobelli, Alberto
Stéphan, Odile
Colliex, Christian

January 2016

International audienceOver the past two or three decades, nanoscience and nanotechnology have clearl...

EELS at very high energy losses

MacLaren, Ian
Annand, Kirsty J.
Black, Colin
Craven, Alan J.

March 2018

Electron energy-loss spectroscopy (EELS) has been investigated in the range from 2 to >10 keV us...

Atomically resolved mapping of EELS fine structures

Gloter, Alexandre
Badjeck, Vincent
Bocher, Laura
Brun, Nathalie
March, Katia
Marinova, Maya
Tencé, Marcel
Walls, Michael
Zobelli, Alberto
Stéphan, Odile
Colliex, Christian

January 2016

International audienceOver the past two or three decades, nanoscience and nanotechnology have clearl...

Chemical and structural characterization of periodic metal/oxide nanometric layers using STEM-EELS

Potin, Valérie
Cacucci, Arnaud
Imhoff, Luc
Martin, Nicolas

January 2013

POSTER - International Electron Energy Loss Spectroscopy Meeting - EDGE 2013, Saint-Maxime, 26 - 31 ...

Chemical and structural characterization of periodic metal/oxide nanometric layers using STEM-EELS

Potin, Valérie
Cacucci, Arnaud
Imhoff, Luc
Martin, Nicolas

January 2013

POSTER - International Electron Energy Loss Spectroscopy Meeting - EDGE 2013, Saint-Maxime, 26 - 31 ...

Chemical and structural characterization of periodic metal/oxide nanometric layers using STEM-EELS

Potin, Valérie
Cacucci, Arnaud
Imhoff, Luc
Martin, Nicolas

January 2013

POSTER - International Electron Energy Loss Spectroscopy Meeting - EDGE 2013, Saint-Maxime, 26 - 31 ...

FINE STRUCTURE IN EELS FROM RARE EARTH SESQUIOXIDE THIN FILMS

L.M. Brown
C. Colliex
M. Gasgnier

January 1984

Les structures fines des seuils d'absorption entre 0 et 2 keV des sesquioxydes de terres rares à l'é...

FINE STRUCTURE IN EELS FROM RARE EARTH SESQUIOXIDE THIN FILMS

L.M. Brown
C. Colliex
M. Gasgnier

January 1984

Les structures fines des seuils d'absorption entre 0 et 2 keV des sesquioxydes de terres rares à l'é...

Element and phase identification via fine structure analysis in EELS: application to MOCVD-Y1Ba2Cu3O7-delta thin films

Grigis, C
Schamm-Chardon, Sylvie

January 1998

International audienceElectron energy loss spectroscopy (EELS) in the transmission electron microsco...

Element and phase identification via fine structure analysis in EELS: application to MOCVD-Y1Ba2Cu3O7-delta thin films

Grigis, C
Schamm-Chardon, Sylvie

January 1998

International audienceElectron energy loss spectroscopy (EELS) in the transmission electron microsco...

Edge effect in the ELNES of Co oxide absorption edges

Zaoli Zhang
Wilfried Sigle
Manfred Rühle

July 2015

EELS probes the unoccupied density of states above the Fermi level. The analysis of the energy-loss ...

Detecting Structural and Bonding Changes in EELS Near-Edge Structures with a Monochromated TEM

G. A. Botton
M. -y. Wu
C. Maunders
J. Etheridge
H. J. Whitfield

October 2016

The enhanced energy resolution in electron energy loss spectroscopy measurements achieved in transmi...

Structural study of thin films by extended energyloss fine structure spectroscopy

De Crescenzi, M.
Motta, N.
Lozzi, L.
Passacantando, M.
Picozzi, P.
Santucci, S.

January 1990

The extended energy loss fine-structure (EELFS) technique, using low kineticenergy electrons in the ...

Spatially Resolved EELS Fine Structures at a $\bf SiO_2/TiO_2$ Interface

Nathalie Brun
Christian Colliex
Josette Rivory
Yu-Zhang Kui

January 1996

$\rm SiO_2/TiO_2$ multilayers stacks used in optical coatings have been studied by Electron Energy L...

EELS at very high energy losses

MacLaren, Ian
Annand, Kirsty J.
Black, Colin
Craven, Alan J.

March 2018

Electron energy-loss spectroscopy (EELS) has been investigated in the range from 2 to >10 keV us...

Atomically resolved mapping of EELS fine structures

Gloter, Alexandre
Badjeck, Vincent
Bocher, Laura
Brun, Nathalie
March, Katia
Marinova, Maya
Tencé, Marcel
Walls, Michael
Zobelli, Alberto
Stéphan, Odile
Colliex, Christian

January 2016

International audienceOver the past two or three decades, nanoscience and nanotechnology have clearl...

EELS at very high energy losses

MacLaren, Ian
Annand, Kirsty J.
Black, Colin
Craven, Alan J.

March 2018

Electron energy-loss spectroscopy (EELS) has been investigated in the range from 2 to >10 keV us...

Atomically resolved mapping of EELS fine structures

Gloter, Alexandre
Badjeck, Vincent
Bocher, Laura
Brun, Nathalie
March, Katia
Marinova, Maya
Tencé, Marcel
Walls, Michael
Zobelli, Alberto
Stéphan, Odile
Colliex, Christian

January 2016

International audienceOver the past two or three decades, nanoscience and nanotechnology have clearl...

Chemical and structural characterization of periodic metal/oxide nanometric layers using STEM-EELS

Potin, Valérie
Cacucci, Arnaud
Imhoff, Luc
Martin, Nicolas

January 2013

POSTER - International Electron Energy Loss Spectroscopy Meeting - EDGE 2013, Saint-Maxime, 26 - 31 ...

Chemical and structural characterization of periodic metal/oxide nanometric layers using STEM-EELS

Potin, Valérie
Cacucci, Arnaud
Imhoff, Luc
Martin, Nicolas

January 2013

POSTER - International Electron Energy Loss Spectroscopy Meeting - EDGE 2013, Saint-Maxime, 26 - 31 ...

Chemical and structural characterization of periodic metal/oxide nanometric layers using STEM-EELS

Potin, Valérie
Cacucci, Arnaud
Imhoff, Luc
Martin, Nicolas

January 2013

POSTER - International Electron Energy Loss Spectroscopy Meeting - EDGE 2013, Saint-Maxime, 26 - 31 ...

FINE STRUCTURE IN EELS FROM RARE EARTH SESQUIOXIDE THIN FILMS

Abstract

Extracted data

FINE STRUCTURE IN EELS FROM RARE EARTH SESQUIOXIDE THIN FILMS

Abstract

Extracted data

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