Add to ORKGProceeding from the discovery of complex singularities of the scattering matrix of a multi-layered parallel-plane dielectric inclusion in a waveguide of rectangular cross section, a method is proposed for justifying unique reconstruction of the layer permittivities. The technique is extended to the analysis of more complicated dielectric inclusions placed in waveguides of arbitrary cross section
This work is aimed at a preliminary design and implementation of a system solving the inverse proble...
Abstract—This paper presents an easy to use method to estimate the thickness and permittivity of lay...
The paper discusses characteristics of a new modeling-based technique for determining dielectric pro...
The paper presents a statement and a proof of uniqueness of solution to the inverse problem of deter...
© 2017 Pushpa Publishing House, Allahabad, India.Uniqueness of a solution to the problem of reconstr...
Complex permittivity of dielectric materials loaded in the cross section of a rect-angular waveguide...
A variety of waveguide structures have been analysed for the measurement of the complex dielectric p...
We present a new method for the numerical reconstruction of the variable refractive index of multi-l...
The inverse problem is considered of reconstructing real permittivity of a plane-parallel layer in a...
The goal of this theoretical study is the improvement of the techniques of determining electromagnet...
In this study, dielectric measurement of homogeneous materials partially loaded in rectangular waveg...
A numerical procedure is given for the reconstruction of the permittivity profile of a dielectric sl...
In this paper, a simple waveguide measurement technique is presented to determine the complex permit...
We present the model of reconstruction of two constant complex dielectrics in a cylindrical waveguid...
A general approach is presented for calculating the aperture admittance of a rectangular waveguide r...
This work is aimed at a preliminary design and implementation of a system solving the inverse proble...
Abstract—This paper presents an easy to use method to estimate the thickness and permittivity of lay...
The paper discusses characteristics of a new modeling-based technique for determining dielectric pro...
The paper presents a statement and a proof of uniqueness of solution to the inverse problem of deter...
© 2017 Pushpa Publishing House, Allahabad, India.Uniqueness of a solution to the problem of reconstr...
Complex permittivity of dielectric materials loaded in the cross section of a rect-angular waveguide...
A variety of waveguide structures have been analysed for the measurement of the complex dielectric p...
We present a new method for the numerical reconstruction of the variable refractive index of multi-l...
The inverse problem is considered of reconstructing real permittivity of a plane-parallel layer in a...
The goal of this theoretical study is the improvement of the techniques of determining electromagnet...
In this study, dielectric measurement of homogeneous materials partially loaded in rectangular waveg...
A numerical procedure is given for the reconstruction of the permittivity profile of a dielectric sl...
In this paper, a simple waveguide measurement technique is presented to determine the complex permit...
We present the model of reconstruction of two constant complex dielectrics in a cylindrical waveguid...
A general approach is presented for calculating the aperture admittance of a rectangular waveguide r...
This work is aimed at a preliminary design and implementation of a system solving the inverse proble...
Abstract—This paper presents an easy to use method to estimate the thickness and permittivity of lay...
The paper discusses characteristics of a new modeling-based technique for determining dielectric pro...