We present a surface profiler that produces unambiguous, fringe-free, surface profiles. Each point in the output image has a modulus of the complex degree of coherence (|μ<sub>xy</sub>|) which varies monotonically as the optical path difference is increased from zero. To calculate |μ<sub>xy</sub>|, the profiler incorporates a novel Stokes polarimeter employing a polarization image splitter and ferroelectric liquid crystal wave plates. Rapid wave plate addressing, coupled with the image splitter, allows data to be collected in three video frames. We observe that manufacturing inaccuracies in wave plate retardance and alignment introduce an error to the calculated |μ<sub>xy</sub>| which can reintroduce ambi...
Lateral optical distortion is present in most optical imaging systems. In coherence scanning interfe...
A sinusoidal phase-modulating Fizeau interferometer using a BaTiO3 self-pumped phase conjugator is c...
Surface topography is an important aspect of materials science and engineer¬ing research with applic...
We present a polarization discriminating interferometer, where the test and reference beams are enco...
The need for ultra-high precision components with sub nanometer surface roughness is now indispensab...
We present an automated surface profiling system based on a shearing interferometer, in which precis...
We propose a liquid crystal (LC)-based 3D optical surface profilometer that can utilize multiple fri...
We report a novel algorithm for the analysis of interferometric images for surface profiling. The al...
One problem interferometric profilers have in common, is that the phase change of the light which is...
When one will measure the precision profiles of super smooth surfaces using an optical interferomete...
Conventional non-contact optical methods of surface profiling are limited in the range of surface he...
The surface structure, especially the roughness, has a significant influence on numerous parameters,...
Optical measurement techniques have been gaining ground for their vast applications in industry and ...
Interferometry 6 : techniques and analysis : Conference : Jul 1993, San Diego, CAWe propose a sinuso...
Traditionally, surface topography measurement was in the domain of quality control of engineering pa...
Lateral optical distortion is present in most optical imaging systems. In coherence scanning interfe...
A sinusoidal phase-modulating Fizeau interferometer using a BaTiO3 self-pumped phase conjugator is c...
Surface topography is an important aspect of materials science and engineer¬ing research with applic...
We present a polarization discriminating interferometer, where the test and reference beams are enco...
The need for ultra-high precision components with sub nanometer surface roughness is now indispensab...
We present an automated surface profiling system based on a shearing interferometer, in which precis...
We propose a liquid crystal (LC)-based 3D optical surface profilometer that can utilize multiple fri...
We report a novel algorithm for the analysis of interferometric images for surface profiling. The al...
One problem interferometric profilers have in common, is that the phase change of the light which is...
When one will measure the precision profiles of super smooth surfaces using an optical interferomete...
Conventional non-contact optical methods of surface profiling are limited in the range of surface he...
The surface structure, especially the roughness, has a significant influence on numerous parameters,...
Optical measurement techniques have been gaining ground for their vast applications in industry and ...
Interferometry 6 : techniques and analysis : Conference : Jul 1993, San Diego, CAWe propose a sinuso...
Traditionally, surface topography measurement was in the domain of quality control of engineering pa...
Lateral optical distortion is present in most optical imaging systems. In coherence scanning interfe...
A sinusoidal phase-modulating Fizeau interferometer using a BaTiO3 self-pumped phase conjugator is c...
Surface topography is an important aspect of materials science and engineer¬ing research with applic...