Fault tolerance is an important issue to worry about in the computing world. The detection of errors provided by transient faults, among others source of errors, in a determined region of a computer architecture is necessary to increase the reliability of the architecture. Circuit level time-redundancy (NICOLAIDIS, 1999) is a good technique to detect transient errors (those caused by transient faults) with low impact in area in a first moment. This work presents two implementations of the technique and the conditions we must respect in order to maximize the error detection without generating false errors signals. In addition, these implementations are used to construct the component that is part of a flexible error handling module (FEHM) (S...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
AbstractIn the complex computing system, processing units are dealing with devices of smaller size, ...
Fault tolerance is one of the main challenges for future technology scaling to tolerate transient fa...
Fault tolerance is an important issue to worry about in the computing world. The detection of errors...
As computer chips implementation technologies evolve to obtain more performance, those computer chip...
Atualmente, a simulação de falhas é um estágio importante em qualquer desenvolvimento de Circuitos I...
International audienceThis work introduces a simulation-based method for evaluating the efficiency o...
AbstractTriple Modular Redundancy (TMR) is real time reliability known to improve computing systems....
Esse trabalho tem como objetivo investigar a influência que a diversidade do hardware impõe sobre su...
Transient faults became an increasing issue in the past few years as smaller geometries of newer, hi...
With the advent of VLSI technology, the systems fabricated in deep sub micron technology are more pr...
Time redundant execution of tasks and comparison of results is a well-known technique for detecting ...
The ever-shrinking technology features have as a direct consequence the increase of defect density i...
IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supp...
This paper presents a non-intrusive hybrid fault detection approach that combines hardware and softw...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
AbstractIn the complex computing system, processing units are dealing with devices of smaller size, ...
Fault tolerance is one of the main challenges for future technology scaling to tolerate transient fa...
Fault tolerance is an important issue to worry about in the computing world. The detection of errors...
As computer chips implementation technologies evolve to obtain more performance, those computer chip...
Atualmente, a simulação de falhas é um estágio importante em qualquer desenvolvimento de Circuitos I...
International audienceThis work introduces a simulation-based method for evaluating the efficiency o...
AbstractTriple Modular Redundancy (TMR) is real time reliability known to improve computing systems....
Esse trabalho tem como objetivo investigar a influência que a diversidade do hardware impõe sobre su...
Transient faults became an increasing issue in the past few years as smaller geometries of newer, hi...
With the advent of VLSI technology, the systems fabricated in deep sub micron technology are more pr...
Time redundant execution of tasks and comparison of results is a well-known technique for detecting ...
The ever-shrinking technology features have as a direct consequence the increase of defect density i...
IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supp...
This paper presents a non-intrusive hybrid fault detection approach that combines hardware and softw...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
AbstractIn the complex computing system, processing units are dealing with devices of smaller size, ...
Fault tolerance is one of the main challenges for future technology scaling to tolerate transient fa...