Verification of the on-die power grid is a key step in the design of complex high performance integrated circuits. For the very large grids in modern designs, incremental verification is highly desirable, because it allows one to skip the verification of a certain section of the grid (internal nodes) and instead, verify only the rest of the grid (external nodes). The focus of this work is to develop efficient techniques for incremental verification in the context of vectorless constraints-based grid verification, under dynamic conditions. The traditional difficulty is that the dynamic case requires iterative analysis of both the internal and the external sections. A solution in the transient case is provided through two key contributions: 1...
Verification of the chip power distribution network is a critical stepin modern IC design. Vectorles...
To ensure the robustness of an integrated circuit design, its power distribution network (PDN) must ...
Power integrity has become a critical issue in nano-scale VLSI design. With technology scaling, the ...
Verification of the on-die power grid is a key step in the design of complex high performance integr...
As technology scaling continues, the performance and reliability of integrated circuits become incre...
The verification of power grids in modern integrated circuits must start early in the design process...
This thesis develops a collection of computer-aided design (CAD) tools for analysis and verification...
Abstract—Power grid verification has become an indispensable step to guarantee a functional and robu...
Design verification must include the power grid. Checking that the voltage on the power grid does no...
With the current aggressive integrated circuit technology scaling, vectorless power grid voltage int...
As part of integrated circuit design verification, one should check if the voltage drop on the power...
Full-chip verification requires one to check if the power grid is safe, i.e., if the voltage drop on...
Vectorless power grid verification algorithms, by solving linear programming (LP) problems under cur...
To deal with the growing phenomenon of electromigration (EM), power grid current integrity verificat...
As part of power distribution network verification, one should check if the voltage fluctuations exc...
Verification of the chip power distribution network is a critical stepin modern IC design. Vectorles...
To ensure the robustness of an integrated circuit design, its power distribution network (PDN) must ...
Power integrity has become a critical issue in nano-scale VLSI design. With technology scaling, the ...
Verification of the on-die power grid is a key step in the design of complex high performance integr...
As technology scaling continues, the performance and reliability of integrated circuits become incre...
The verification of power grids in modern integrated circuits must start early in the design process...
This thesis develops a collection of computer-aided design (CAD) tools for analysis and verification...
Abstract—Power grid verification has become an indispensable step to guarantee a functional and robu...
Design verification must include the power grid. Checking that the voltage on the power grid does no...
With the current aggressive integrated circuit technology scaling, vectorless power grid voltage int...
As part of integrated circuit design verification, one should check if the voltage drop on the power...
Full-chip verification requires one to check if the power grid is safe, i.e., if the voltage drop on...
Vectorless power grid verification algorithms, by solving linear programming (LP) problems under cur...
To deal with the growing phenomenon of electromigration (EM), power grid current integrity verificat...
As part of power distribution network verification, one should check if the voltage fluctuations exc...
Verification of the chip power distribution network is a critical stepin modern IC design. Vectorles...
To ensure the robustness of an integrated circuit design, its power distribution network (PDN) must ...
Power integrity has become a critical issue in nano-scale VLSI design. With technology scaling, the ...