Determination of thickness and optical constants of thin films by dual medium and multi-wavelength SPR spectroscopy

The determination of thickness and refractive index of very thin organic layers with SPR has been less straightforward as more expensive techniques, such as ellipsometry. We have used Multi-Parameter Surface Plasmon Resonance (MP-SPR) spectroscopy as a means to achieve this decomposition, by using two different measurement media. SPR spectral data sets were globally fitted directly to the theoretical spectra and the parameters for the optical constants were extracted at three wavelength