The authors report optical properties of in situ passivated AlGaAs and GaAs surfaces. The deposition of an ultra thin InP layer (about one monolayer) on the surface of AlGaAs/GaAs structures by metalorganic vapor phase epitaxy (MOVPE) results in drastically reduced surface recombination. The effect is studied by low-temperature photoluminescence (PL) of near-surface AlGaAs/GaAs quantum wells (QW) where the top barrier thickness is varied from 0 to 50 nm. At the thickness of 15 nm the intensity from passivated samples is more than four orders of magnitude larger than obtained from unpassivated structures. Photoreflectance (PR) measurements are used to determine the Fermi level pinning at the surface. The InP passivation is shown to reduce th...
Metalorganic vapour phase epitaxy is used for growth of low-dimensional III-V semiconductor structur...
Photoluminescence (PL) measurements are presented for thin epitaxial layers of InAs, 2.5 Å<d <36 Å, ...
Low temperature (∼200 ◦C) grown atomic layer deposition (ALD) films of AlN, TiN, Al2O3, GaN, and TiO...
An epitaxial method for in situ passivation of epitaxial AlxGa1−xAs/GaAs surfaces is reported. The d...
Carrier recombination in surface and near-surface In/sub x/Ga/sub 1-x/As/GaAs quantum wells was stud...
Carrier recombination in surface and near-surface InxGa1-xAs/GaAs quantum wells was studied using ti...
The optical properties of the in situ epitaxial GaN and InP passivated InGaAs∕GaAs near-surface quan...
We have investigated the optical properties of an InGaAs/InP surface quantum well before and after r...
An epitaxial method for in situpassivation of epitaxial Al x Ga1−x As/GaAs surfaces is reported. The...
Photoluminescence (PL) measurements have been used to examine the influence which the proximity of t...
Low temperature PL measurements are reported for a series of In0.26Ga0.74As/GaAs(100) quantum well (...
Etched GaAs quantum wires (QWRs) and selectively grown (SG) QWRs were fabricated, and dependence of ...
The authors report a comparative study on ex situ passivation of a near-surface GaAs0.86P0.14/Al0.6G...
The optical properties of the in situepitaxialGaN and InP passivated InGaAs∕GaAs near-surface quantu...
Several passivation techniques are developed and compared in terms of their ability to preserve the ...
Metalorganic vapour phase epitaxy is used for growth of low-dimensional III-V semiconductor structur...
Photoluminescence (PL) measurements are presented for thin epitaxial layers of InAs, 2.5 Å<d <36 Å, ...
Low temperature (∼200 ◦C) grown atomic layer deposition (ALD) films of AlN, TiN, Al2O3, GaN, and TiO...
An epitaxial method for in situ passivation of epitaxial AlxGa1−xAs/GaAs surfaces is reported. The d...
Carrier recombination in surface and near-surface In/sub x/Ga/sub 1-x/As/GaAs quantum wells was stud...
Carrier recombination in surface and near-surface InxGa1-xAs/GaAs quantum wells was studied using ti...
The optical properties of the in situ epitaxial GaN and InP passivated InGaAs∕GaAs near-surface quan...
We have investigated the optical properties of an InGaAs/InP surface quantum well before and after r...
An epitaxial method for in situpassivation of epitaxial Al x Ga1−x As/GaAs surfaces is reported. The...
Photoluminescence (PL) measurements have been used to examine the influence which the proximity of t...
Low temperature PL measurements are reported for a series of In0.26Ga0.74As/GaAs(100) quantum well (...
Etched GaAs quantum wires (QWRs) and selectively grown (SG) QWRs were fabricated, and dependence of ...
The authors report a comparative study on ex situ passivation of a near-surface GaAs0.86P0.14/Al0.6G...
The optical properties of the in situepitaxialGaN and InP passivated InGaAs∕GaAs near-surface quantu...
Several passivation techniques are developed and compared in terms of their ability to preserve the ...
Metalorganic vapour phase epitaxy is used for growth of low-dimensional III-V semiconductor structur...
Photoluminescence (PL) measurements are presented for thin epitaxial layers of InAs, 2.5 Å<d <36 Å, ...
Low temperature (∼200 ◦C) grown atomic layer deposition (ALD) films of AlN, TiN, Al2O3, GaN, and TiO...