Lighting impulse measurements are made as a matter of routine in high voltage testing of high-voltage electrical equipment. The test is often decisive for acceptance of the equipment under test, and consequently proper and precise calibration of the measuring system is needed. The present work centres on the need to quantify the errors of reference measuring systems for lightning impulse. Scale factor determination at low frequency (or DC) is the starting point for this determination. The extrapolation from this frequency domain to the domain where microsecond pulses must be faithfully captured requires application either of methods in the frequency domain or in the time domain. Radio frequency measurements are only well defined for coaxial...
Some high voltage applications use very fast impulses with rise time less than 100 nanoseconds. Meas...
A new algorithm has been proposed to calculate the parameters of full lightning voltage impulses. Th...
The recent push to higher testing voltages for research and production tests onUHV system components...
Lighting impulse measurements are made as a matter of routine in high voltage testing of high-voltag...
High voltage equipment will be subjected to several types of electrical stress during operation. A b...
An effort is pursued by several European National Measurement Institutes to lower the uncertainties ...
Lightning impulse measurements can be highly influenced by measurement arrangement, characteristics ...
Abstract:- This paper presents the design and development of the computer algorithm based on LabVIEW...
Lightning impulse measurements can be highly influenced by measurement arrangement, characteristics ...
This paper focuses on development of an existing 1 MV lightning impulse (LI) measuring system as par...
Traceable calibrations of current sensors with nanosecond rise-times and amplitude of several hundre...
The next revision of the international standard for high voltage measurement techniques, IEC 60060-1...
Driven by the need for traceable measurement methods, LNE has developed and characterized new refere...
The lightning-flash counter sponsored by CIGRÉ is normally tested with sinusoidal alternating voltag...
High voltage equipment is subjected to several types of electrical stress during operation, why test...
Some high voltage applications use very fast impulses with rise time less than 100 nanoseconds. Meas...
A new algorithm has been proposed to calculate the parameters of full lightning voltage impulses. Th...
The recent push to higher testing voltages for research and production tests onUHV system components...
Lighting impulse measurements are made as a matter of routine in high voltage testing of high-voltag...
High voltage equipment will be subjected to several types of electrical stress during operation. A b...
An effort is pursued by several European National Measurement Institutes to lower the uncertainties ...
Lightning impulse measurements can be highly influenced by measurement arrangement, characteristics ...
Abstract:- This paper presents the design and development of the computer algorithm based on LabVIEW...
Lightning impulse measurements can be highly influenced by measurement arrangement, characteristics ...
This paper focuses on development of an existing 1 MV lightning impulse (LI) measuring system as par...
Traceable calibrations of current sensors with nanosecond rise-times and amplitude of several hundre...
The next revision of the international standard for high voltage measurement techniques, IEC 60060-1...
Driven by the need for traceable measurement methods, LNE has developed and characterized new refere...
The lightning-flash counter sponsored by CIGRÉ is normally tested with sinusoidal alternating voltag...
High voltage equipment is subjected to several types of electrical stress during operation, why test...
Some high voltage applications use very fast impulses with rise time less than 100 nanoseconds. Meas...
A new algorithm has been proposed to calculate the parameters of full lightning voltage impulses. Th...
The recent push to higher testing voltages for research and production tests onUHV system components...