This paper presents a new system architecture for implementing fault-tolerant information processing. The proposed structure relies on simple processing elements (PEs) arranged into a regular locally-interconnected array. Such an approach is a favorable way of implementing circuits with inherently unreliable nanodevices. Different network operations are achieved through binary programmable interconnections. The array can be divided into a set of software-defined segments for implementing functions with different levels of complexity and redundancy, assuring the system versatility and flexibility. The examples of basic Boolean operations are presented. The error correction mechanism is explained and its impact on fault-tolerance is briefly a...
In future nanotechnologies failure densities are predicted to be several orders of magnitude higher ...
Targeting on the future fault-prone hybrid CMOS/Nanodevice digital memories, this paper present two ...
Abstract. A reliable circuit-design methodology [6] based on simple feed-forward neural networks (wi...
This paper presents a new system architecture for implementing fault-tolerant information processing...
This paper presents a new approach towards fault-tolerant information processing. The proposed syste...
This paper presents the architecture for a nanoelectronic logic system in which a regular array of l...
This paper focuses on the investigation of efficient methods to evaluate circuit fault-tolerance. We...
This paper focuses on the investigation of efficient methods to evaluate circuit fault-tolerance. We...
The error rate in complementary transistor circuits is suppressed exponentially in electron number, ...
This paper presents a single-electron tunneling (SET) device implementation of gates needed to build...
The progress in CMOS technology has entered the sub-micron realm, and the technology will approach i...
Nanoelectronics, promising significant boosts in device density, power and performance, has been pro...
Abstract — As silicon circuits quickly approach their physical limitations, researchers are actively...
Abstract—Nanoscale processor designs pose new challenges not encountered in the world of conventiona...
Nanoscale processor designs pose new challenges not encountered in the world of conventional CMOS de...
In future nanotechnologies failure densities are predicted to be several orders of magnitude higher ...
Targeting on the future fault-prone hybrid CMOS/Nanodevice digital memories, this paper present two ...
Abstract. A reliable circuit-design methodology [6] based on simple feed-forward neural networks (wi...
This paper presents a new system architecture for implementing fault-tolerant information processing...
This paper presents a new approach towards fault-tolerant information processing. The proposed syste...
This paper presents the architecture for a nanoelectronic logic system in which a regular array of l...
This paper focuses on the investigation of efficient methods to evaluate circuit fault-tolerance. We...
This paper focuses on the investigation of efficient methods to evaluate circuit fault-tolerance. We...
The error rate in complementary transistor circuits is suppressed exponentially in electron number, ...
This paper presents a single-electron tunneling (SET) device implementation of gates needed to build...
The progress in CMOS technology has entered the sub-micron realm, and the technology will approach i...
Nanoelectronics, promising significant boosts in device density, power and performance, has been pro...
Abstract — As silicon circuits quickly approach their physical limitations, researchers are actively...
Abstract—Nanoscale processor designs pose new challenges not encountered in the world of conventiona...
Nanoscale processor designs pose new challenges not encountered in the world of conventional CMOS de...
In future nanotechnologies failure densities are predicted to be several orders of magnitude higher ...
Targeting on the future fault-prone hybrid CMOS/Nanodevice digital memories, this paper present two ...
Abstract. A reliable circuit-design methodology [6] based on simple feed-forward neural networks (wi...