We present a study of a cold-electron bolometer operating at 350 mK with a twin-slot antenna coupling radiation at 160 GHz. The detector's absorbing element consists of degenerately-doped strained silicon and has Schottky contacts to superconducting aluminium leads. These contacts allow for direct electron cooling of the absorber to below the phonon temperature, enabling the cold-electron bolometer to achieve much faster time constants (τ <; 1 μs) compared to conventional bolometric detectors while not sacrificing sensitivity. We measure both the dark and optically-loaded noise of the detector via a novel method of cross-correlating the outputs of two amplifiers in order to measure noise below the amplifier noise level. From this we meas...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe the optical characterisation of two silicon cold-electron bolometers each consisting of ...
We describe the optical characterisation of two silicon cold-electron bolometers each consisting of ...
We present a study of a cold-electron bolometer operating at 350 mK with a twin-slot antenna couplin...
We present a study of a cold-electron bolometer operating at 350 mK with a twin-slot antenna couplin...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe the optical characterisation of two silicon cold-electron bolometers each consisting of ...
We describe the optical characterisation of two silicon cold-electron bolometers each consisting of ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe the optical characterisation of two silicon cold-electron bolometers each consisting of ...
We describe the optical characterisation of two silicon cold-electron bolometers each consisting of ...
We present a study of a cold-electron bolometer operating at 350 mK with a twin-slot antenna couplin...
We present a study of a cold-electron bolometer operating at 350 mK with a twin-slot antenna couplin...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe the optical characterisation of two silicon cold-electron bolometers each consisting of ...
We describe the optical characterisation of two silicon cold-electron bolometers each consisting of ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe optical characterisation of a strained silicon cold electron bolometer (CEB), operating ...
We describe the optical characterisation of two silicon cold-electron bolometers each consisting of ...
We describe the optical characterisation of two silicon cold-electron bolometers each consisting of ...