Measurement of temperature-dependent relaxation oscillation frequency and linewidth enhancement factor of a 1550 nm VCSEL
- Khan, Nadir Ali
- Schires, Kevin
- Hurtado, Antonio
- Henning, Ian D.
- Adams, Michael J.
Publication date
November 2013
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
In this paper, we present detailed measurements of the temperature- dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20 °C to 60 °C.. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials
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