This dissertation presents approaches to improve circuit reliability and energy efficiency from different angles, such as verification, logic synthesis, and functional unit design. A variety of algorithmic methods and heuristics are used in our approaches such as SAT solving, data mining, logic restructuring, and applied mathematics. Furthermore, the scalability of our approaches was taken into account while we developed our solutions. Experimental results show that our approaches offer the following advantages: 1) SAT-BAG can generate concise assertions that can always achieve 100% input space coverage. 2) C-Mine-DCT, compared to a recent publication, can achieve compatible performance with an additional 8% energy saving and 54x speedup f...
In today's leading-edge semiconductor technologies, it is increasingly difficult for IC designers to...
Reliability of logic circuits is emerging as an important concern that may limit the benefits of con...
This thesis addresses the circuit and layout issues of the Complementary Metal-Oxide-Semiconductor (...
This dissertation presents approaches to improve circuit reliability and energy efficiency from diff...
Reliability is an important issue in very large scale integration(VLSI) circuits. In the absence of ...
The pace of technological improvement of the semiconductor market is driven by Moore’s Law, enabling...
We initiate the theoretical investigation of energy-efficient circuit design. We assume that the cir...
We initiate the theoretical investigation of energy-efficient circuit design. We assume that the cir...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Comp...
An increasing amount of 'smart' electronic devices is filling our everyday lives and the environment...
A primary design goal for VLSI systems is to achieve low energy consumption while maintaining high p...
2011-11-16As CMOS transistors are scaled toward ultra deep submicron technologies, circuit reliabili...
University of Minnesota Ph.D. dissertation. October 2009. Major: Electrical Engineering. Advisor: Ch...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer S...
127 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.With the advent of deep submi...
In today's leading-edge semiconductor technologies, it is increasingly difficult for IC designers to...
Reliability of logic circuits is emerging as an important concern that may limit the benefits of con...
This thesis addresses the circuit and layout issues of the Complementary Metal-Oxide-Semiconductor (...
This dissertation presents approaches to improve circuit reliability and energy efficiency from diff...
Reliability is an important issue in very large scale integration(VLSI) circuits. In the absence of ...
The pace of technological improvement of the semiconductor market is driven by Moore’s Law, enabling...
We initiate the theoretical investigation of energy-efficient circuit design. We assume that the cir...
We initiate the theoretical investigation of energy-efficient circuit design. We assume that the cir...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Comp...
An increasing amount of 'smart' electronic devices is filling our everyday lives and the environment...
A primary design goal for VLSI systems is to achieve low energy consumption while maintaining high p...
2011-11-16As CMOS transistors are scaled toward ultra deep submicron technologies, circuit reliabili...
University of Minnesota Ph.D. dissertation. October 2009. Major: Electrical Engineering. Advisor: Ch...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer S...
127 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.With the advent of deep submi...
In today's leading-edge semiconductor technologies, it is increasingly difficult for IC designers to...
Reliability of logic circuits is emerging as an important concern that may limit the benefits of con...
This thesis addresses the circuit and layout issues of the Complementary Metal-Oxide-Semiconductor (...