State Justification Using Genetic Algorithms in Sequential Circuit Test Generation

Summary

August 2015

Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...

Fault Ordering in Sequential Automatic Test Pattern Generation

Heydinger, Scott Michael

January 10000

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...

On the Design of Diagnosable Asynchronous Sequential Machines

Patterson, William Wise

January 10000

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electr...

State Justification Using Genetic Algorithms in Sequential Circuit Test Generation

Rudnick, Elizabeth Marie
Patel, Janak H.

January 1996

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryARPA / DABT63-95-C-00...

Genetic Algorithm Based Functional Test Generation

Miyazaki, Koichiro

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryDARPA / DABT63-95-C-0...

Sequential Circuit Test Generation Using Genetic Techniques

Hsiao, Michael Shaun

Semiconductor Research Corporation / 96-DP-109U of I OnlyRestricted to UIUC communit

New Algorithms for Sequential Diagnosis

Khanna, Sanjeev

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electr...

The Complexity of Test Generation at the Transistor Level

Najm, Farid
Hajj, Ibrahim

December 1987

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...

An Algorithm for the Synthesis of Large Sequential Switching Circuits

Elsey, John

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryContract DA-36-039-TR...

A Genetic-Algorithm Approach to Architectural-Level Justification of Precomputed Vectors

Hsiao, Michael S.
Patel, Janak H.

September 1996

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...

Generation of Diagnostic Tests Using Prime Implicants

Paige, Michael Reid

May 1969

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electr...

On the Generation of Diagnostic Test Procedures

Bouknight, Wendell J.

January 10000

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electr...

Switch-Level Test Generation for MOS VLSI Circuits

Najm, Farid Nasri

January 10000

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...

An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation

El-Maleh, Aiman H.
Sait, Sadiq M.
Shazli, Syed Z.

January 2001

Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...

Algorithms for Minimizing Test Sets for CMOS VLSI Circuits

Stancil, Charles Jay

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...

Summary

August 2015

Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...

Fault Ordering in Sequential Automatic Test Pattern Generation

Heydinger, Scott Michael

January 10000

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...

On the Design of Diagnosable Asynchronous Sequential Machines

Patterson, William Wise

January 10000

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electr...

State Justification Using Genetic Algorithms in Sequential Circuit Test Generation

Rudnick, Elizabeth Marie
Patel, Janak H.

January 1996

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryARPA / DABT63-95-C-00...

Genetic Algorithm Based Functional Test Generation

Miyazaki, Koichiro

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryDARPA / DABT63-95-C-0...

Sequential Circuit Test Generation Using Genetic Techniques

Hsiao, Michael Shaun

Semiconductor Research Corporation / 96-DP-109U of I OnlyRestricted to UIUC communit

New Algorithms for Sequential Diagnosis

Khanna, Sanjeev

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electr...

The Complexity of Test Generation at the Transistor Level

Najm, Farid
Hajj, Ibrahim

December 1987

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...

An Algorithm for the Synthesis of Large Sequential Switching Circuits

Elsey, John

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryContract DA-36-039-TR...

A Genetic-Algorithm Approach to Architectural-Level Justification of Precomputed Vectors

Hsiao, Michael S.
Patel, Janak H.

September 1996

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...

Generation of Diagnostic Tests Using Prime Implicants

Paige, Michael Reid

May 1969

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electr...

On the Generation of Diagnostic Test Procedures

Bouknight, Wendell J.

January 10000

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electr...

Switch-Level Test Generation for MOS VLSI Circuits

Najm, Farid Nasri

January 10000

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...

An Evolutionary Meta-Heuristic for State Justification in Sequential Automatic Test Pattern Generation

El-Maleh, Aiman H.
Sait, Sadiq M.
Shazli, Syed Z.

January 2001

Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...

Algorithms for Minimizing Test Sets for CMOS VLSI Circuits

Stancil, Charles Jay

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...

Summary

August 2015

Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...

Fault Ordering in Sequential Automatic Test Pattern Generation

Heydinger, Scott Michael

January 10000

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...

On the Design of Diagnosable Asynchronous Sequential Machines

Patterson, William Wise

January 10000

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electr...

State Justification Using Genetic Algorithms in Sequential Circuit Test Generation

Abstract

Extracted data

State Justification Using Genetic Algorithms in Sequential Circuit Test Generation

Abstract

Extracted data

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