Semiconductor Research Corp. and Hewlett-Packard Corp.92-DP-109 VLSI ReliabilityU of I Onlythesi
NXP Semiconductor à Caen ayant des compétences dans le développement destechnologies System in Packa...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
A new approach to MOS circuit fast timing simulation is shown in this thesis. A generic MOS circuit ...
Semiconductor Research Corp. and Hewlett-Packard Corp.92-DP-109 VLSI ReliabilityU of I Onlythesi
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySRC / 92-DP-109U of I...
This paper presents an alternative modeling and simulation method for CMOS bridging faults. The sign...
Integrated electronic systems are more and more used in a wide number of applications and environmen...
For the past 40 years, Moore\u27s Law---which describes the unrelenting improvement in CMOS technolo...
Abstract — Deeply scaled CMOS circuits are increasingly sus-ceptible to transient faults and soft er...
SRCHewlett-PackardSemiconductor Research Corporation (including SRC member companies Hewlett-Packard...
SIGLEAvailable from British Library Document Supply Centre-DSC:DXN027713 / BLDSC - British Library D...
Motivated by the recent advances in fast fault simu-lation techniques for large combinational circui...
Continuous technology scaling in semiconductor industry forces reliability as a serious design conce...
AbstractIn this paper, a novel approach is introduced on accelerating the fault simulation speed on ...
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...
NXP Semiconductor à Caen ayant des compétences dans le développement destechnologies System in Packa...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
A new approach to MOS circuit fast timing simulation is shown in this thesis. A generic MOS circuit ...
Semiconductor Research Corp. and Hewlett-Packard Corp.92-DP-109 VLSI ReliabilityU of I Onlythesi
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySRC / 92-DP-109U of I...
This paper presents an alternative modeling and simulation method for CMOS bridging faults. The sign...
Integrated electronic systems are more and more used in a wide number of applications and environmen...
For the past 40 years, Moore\u27s Law---which describes the unrelenting improvement in CMOS technolo...
Abstract — Deeply scaled CMOS circuits are increasingly sus-ceptible to transient faults and soft er...
SRCHewlett-PackardSemiconductor Research Corporation (including SRC member companies Hewlett-Packard...
SIGLEAvailable from British Library Document Supply Centre-DSC:DXN027713 / BLDSC - British Library D...
Motivated by the recent advances in fast fault simu-lation techniques for large combinational circui...
Continuous technology scaling in semiconductor industry forces reliability as a serious design conce...
AbstractIn this paper, a novel approach is introduced on accelerating the fault simulation speed on ...
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...
NXP Semiconductor à Caen ayant des compétences dans le développement destechnologies System in Packa...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
A new approach to MOS circuit fast timing simulation is shown in this thesis. A generic MOS circuit ...