Add to ORKG92 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2006.Overall, this dissertation lays the basic foundation for microarchitectural analysis of lifetime reliability and provides new tools and techniques to handle this critical emerging technology challenge.U of I OnlyRestricted to the U of I community idenfinitely during batch ingest of legacy ETD
68 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1966.U of I OnlyRestricted to the U...
Rapid device aging in the nano era threatens system lifetime reliability, posing a major intrinsic t...
Meeting reliability targets with viable costs in the nanometer landscape become a significant challe...
92 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2006.Overall, this dissertation lay...
This work concerns appropriate metrics for evaluating microarchitectural enhancements to improve pro...
This work concerns appropriate metrics for evaluating microarchitectural enhancements to improve pro...
Submitted for publication. Please do not distribute. Although device scaling has been providing stea...
I declare that this thesis is my own, unaided work. It is being submitted for the Degree of Doctor o...
10.1109/VLSID.2013.192Proceedings of the IEEE International Conference on VLSI Design227-232PIVD
Increased power densities (and resultant temperatures) and other effects of device scaling are predi...
172 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1979.U of I OnlyRestricted to the ...
Increased power densities (and resultant temperatures) and other effects of device scaling are predi...
UnrestrictedDeep submicron semiconductor technologies enable greater degrees of device integration a...
In safety related applications and in products with long lifetimes reliability is a must. More...
347 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1973.U of I OnlyRestricted to the ...
68 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1966.U of I OnlyRestricted to the U...
Rapid device aging in the nano era threatens system lifetime reliability, posing a major intrinsic t...
Meeting reliability targets with viable costs in the nanometer landscape become a significant challe...
92 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2006.Overall, this dissertation lay...
This work concerns appropriate metrics for evaluating microarchitectural enhancements to improve pro...
This work concerns appropriate metrics for evaluating microarchitectural enhancements to improve pro...
Submitted for publication. Please do not distribute. Although device scaling has been providing stea...
I declare that this thesis is my own, unaided work. It is being submitted for the Degree of Doctor o...
10.1109/VLSID.2013.192Proceedings of the IEEE International Conference on VLSI Design227-232PIVD
Increased power densities (and resultant temperatures) and other effects of device scaling are predi...
172 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1979.U of I OnlyRestricted to the ...
Increased power densities (and resultant temperatures) and other effects of device scaling are predi...
UnrestrictedDeep submicron semiconductor technologies enable greater degrees of device integration a...
In safety related applications and in products with long lifetimes reliability is a must. More...
347 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1973.U of I OnlyRestricted to the ...
68 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1966.U of I OnlyRestricted to the U...
Rapid device aging in the nano era threatens system lifetime reliability, posing a major intrinsic t...
Meeting reliability targets with viable costs in the nanometer landscape become a significant challe...