97 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000.The combined P3M-EMC method is tested for large and short channel-length silicon MOSFETs and results are compared with continuum simulations in 2D and 3D. The results indicate that classical short-range Coulomb methods such as the P3M-EMC method can match bulk mobilities and kinietic energies predicted by the modified Hartree model. Results predict cooler hot carrier tails than do methods that use c-i scattering rates and do not consider c-c interaction. Finally, timing analysis shows that the classical molecular-dynamical methods like the P3M-EMC method can simulate very-small devices with modest additional cost compared to the traditional Monte Carlo device simulation m...
Monte Carlo (MC) device simulations of high energy electrons and holes in Si-n-MOSFET's are presente...
Electron-electron and electron-impurity interactions play an important role in ultra-small MOSFETs. ...
We review the Monte Carlo method to model semi-classical carrier transport in advanced semiconductor...
We have developed a three-dimensional particle based simulator with a coupled molecular dynamics rou...
The simultaneous explosion of portable microelectronics devices and the rapid shrinking of microproc...
This is the final report of a three-year, Laboratory-Directed Research and Development (LDRD) projec...
This work presents a study of the applicability of a massively parallel computing paradigm to Monte ...
We have investigated three-dimensional (3D) effects in sub-micron GaAs MESFETs using a parallel Mont...
A full-band Monte Carlo device simulator has been used to study the effects of device scaling on hot...
A full-band Monte Carlo device simulator has been used to study the effects of device scaling on hot...
We present a 3D Ensemble Monte Carlo particle-based simulator with a novel realspace treatment of th...
92 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.A full-band 3D Monte Carlo sem...
92 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.A full-band 3D Monte Carlo sem...
Le rendement consommation/fréquence des futures générations de circuits intégrés sur silicium n’est ...
Monte Carlo (MC) device simulations of high energy electrons and holes in Si-n-MOSFET's are presente...
Monte Carlo (MC) device simulations of high energy electrons and holes in Si-n-MOSFET's are presente...
Electron-electron and electron-impurity interactions play an important role in ultra-small MOSFETs. ...
We review the Monte Carlo method to model semi-classical carrier transport in advanced semiconductor...
We have developed a three-dimensional particle based simulator with a coupled molecular dynamics rou...
The simultaneous explosion of portable microelectronics devices and the rapid shrinking of microproc...
This is the final report of a three-year, Laboratory-Directed Research and Development (LDRD) projec...
This work presents a study of the applicability of a massively parallel computing paradigm to Monte ...
We have investigated three-dimensional (3D) effects in sub-micron GaAs MESFETs using a parallel Mont...
A full-band Monte Carlo device simulator has been used to study the effects of device scaling on hot...
A full-band Monte Carlo device simulator has been used to study the effects of device scaling on hot...
We present a 3D Ensemble Monte Carlo particle-based simulator with a novel realspace treatment of th...
92 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.A full-band 3D Monte Carlo sem...
92 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.A full-band 3D Monte Carlo sem...
Le rendement consommation/fréquence des futures générations de circuits intégrés sur silicium n’est ...
Monte Carlo (MC) device simulations of high energy electrons and holes in Si-n-MOSFET's are presente...
Monte Carlo (MC) device simulations of high energy electrons and holes in Si-n-MOSFET's are presente...
Electron-electron and electron-impurity interactions play an important role in ultra-small MOSFETs. ...
We review the Monte Carlo method to model semi-classical carrier transport in advanced semiconductor...