Automatic Test Generation Techniques for Sequential Circuits

107 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2002.Finally, a GA-based diagnostic test generation approach is proposed for sequential circuits. A simple GA, which interacts with an efficient diagnostic fault simulator, is proposed to target groups of undistinguished fault pairs iteratively. Efficient data structures are used and heuristics are proposed to seed the initial populations of the GA. Experimental results also demonstrate the efficiency of the proposed method.U of I OnlyRestricted to the U of I community idenfinitely during batch ingest of legacy ETD