With transistor dimensions shrinking to the atomic scale, a plethora of new reliability problems presents a barrier to continued Moore’s law scaling. Traditional modular redundancy techniques with 2x and 3x area cost eliminate the area reduction benefits of such scaling. In this study, we take a partial redundancy approach to the reliability problem for arithmetic-orientated datapaths by performing lightweight shadow computations in the mod-b space, where b is the base of our modulo residue, for each main computation. We leverage the binding and scheduling flexibility of high-level synthesis to detect control errors through diverse binding and minimize area cost through intelligent checkpoint scheduling and modulo-b reducer sharing. We intr...
Soft-error detection in FPGAs typically requires replication, doubling the required area. We propose...
Scaling of transistor's channel length is entering the realm of atomic and molecular geometries maki...
Logic synthesis is one of the key stages in the computer-aided design (CAD) flow for a field program...
With transistor dimensions shrinking to the atomic scale, a plethora of new reliability problems pre...
System-on-chip design is becoming increasingly complex as technology scaling enables more and more f...
System-on-chip design is becoming increasingly complex as technology scaling enables more and more f...
System-on-chip design is becoming increasingly complex as technology scaling enables more and more f...
Importance of addressing soft errors in both safety critical applications and commercial consumer pr...
Fault Tolerant Sublithographic Design with Rollback Recovery Shrinking feature sizes and energy leve...
Shrinking of the device feature size allows high complexity systems to be designed and integrated wi...
Shrinking of the device feature size allows high complexity systems to be designed and integrated wi...
Shrinking feature sizes and energy levels coupled with high clock rates and decreasing node capacita...
Importance of addressing soft errors in both safety critical applications and commercial consumer pr...
Importance of addressing soft errors in both safety critical applications and commercial consumer pr...
Scaling of transistor's channel length is entering the realm of atomic and molecular geometries maki...
Soft-error detection in FPGAs typically requires replication, doubling the required area. We propose...
Scaling of transistor's channel length is entering the realm of atomic and molecular geometries maki...
Logic synthesis is one of the key stages in the computer-aided design (CAD) flow for a field program...
With transistor dimensions shrinking to the atomic scale, a plethora of new reliability problems pre...
System-on-chip design is becoming increasingly complex as technology scaling enables more and more f...
System-on-chip design is becoming increasingly complex as technology scaling enables more and more f...
System-on-chip design is becoming increasingly complex as technology scaling enables more and more f...
Importance of addressing soft errors in both safety critical applications and commercial consumer pr...
Fault Tolerant Sublithographic Design with Rollback Recovery Shrinking feature sizes and energy leve...
Shrinking of the device feature size allows high complexity systems to be designed and integrated wi...
Shrinking of the device feature size allows high complexity systems to be designed and integrated wi...
Shrinking feature sizes and energy levels coupled with high clock rates and decreasing node capacita...
Importance of addressing soft errors in both safety critical applications and commercial consumer pr...
Importance of addressing soft errors in both safety critical applications and commercial consumer pr...
Scaling of transistor's channel length is entering the realm of atomic and molecular geometries maki...
Soft-error detection in FPGAs typically requires replication, doubling the required area. We propose...
Scaling of transistor's channel length is entering the realm of atomic and molecular geometries maki...
Logic synthesis is one of the key stages in the computer-aided design (CAD) flow for a field program...