Complete filling of a deep recessed structure with a second material is a challenge in many areas of nanotechnology fabrication, including MEMS devices, metallization and shallow trench isolation (STI) in integrated circuits. For structures with straight sidewalls, uniform coating methods – including chemical vapor deposition (CVD) or atomic layer deposition (ALD) – typically form a void or region of low density (seam) along the centerline of the feature because the transport of precursor molecules to the bottom becomes rate limiting. These defects undermine device properties and methods are needed to afford complete filling. One approach is to taper the two sidewalls slightly inwards. However, the requirement for tapering is an undesirable...
The miniaturization of devices places stringent demands on materials processing techniques. As devi...
Functionalization of surfaces is an important task for nanotechnology to add specially designed phys...
We present a process for the void-free filling of sub-100 nm trenches with copper or copper-manganes...
Void-free filling of high aspect ratio (AR = 3 to 10) structures, such as trenches or vias, is neces...
Chemical vapor deposition can afford conformal films with step coverage> 90 % in via or trench fe...
The principal contribution of this Ph.D. research is to explore the chemical interactions of co-reac...
The approaches to conformal and superconformal deposition developed by Abelson and Girolami for a lo...
139 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2009.The Holy Grail in CVD communi...
Conformal coatings are becoming increasingly important as technology heads towards the nanoscale. T...
Atomic layer deposition (ALD) is a thin-film growth method that is characterized by alternating expo...
Atomic layer deposition (ALD) relies on alternated, self-limiting reactions between gaseous reactant...
Atomic layer deposition (ALD) is a technique of choice for a uniform, conformal coating of substrate...
Atomic layer deposition (ALD) relies on alternated, self-limiting reactions between gaseous reactant...
Thin, nearly conformal films are required for semiconductor applications to function as diffusion ba...
Publisher Copyright: © 2022 The Royal Society of ChemistryUnparalleled conformality is driving ever ...
The miniaturization of devices places stringent demands on materials processing techniques. As devi...
Functionalization of surfaces is an important task for nanotechnology to add specially designed phys...
We present a process for the void-free filling of sub-100 nm trenches with copper or copper-manganes...
Void-free filling of high aspect ratio (AR = 3 to 10) structures, such as trenches or vias, is neces...
Chemical vapor deposition can afford conformal films with step coverage> 90 % in via or trench fe...
The principal contribution of this Ph.D. research is to explore the chemical interactions of co-reac...
The approaches to conformal and superconformal deposition developed by Abelson and Girolami for a lo...
139 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2009.The Holy Grail in CVD communi...
Conformal coatings are becoming increasingly important as technology heads towards the nanoscale. T...
Atomic layer deposition (ALD) is a thin-film growth method that is characterized by alternating expo...
Atomic layer deposition (ALD) relies on alternated, self-limiting reactions between gaseous reactant...
Atomic layer deposition (ALD) is a technique of choice for a uniform, conformal coating of substrate...
Atomic layer deposition (ALD) relies on alternated, self-limiting reactions between gaseous reactant...
Thin, nearly conformal films are required for semiconductor applications to function as diffusion ba...
Publisher Copyright: © 2022 The Royal Society of ChemistryUnparalleled conformality is driving ever ...
The miniaturization of devices places stringent demands on materials processing techniques. As devi...
Functionalization of surfaces is an important task for nanotechnology to add specially designed phys...
We present a process for the void-free filling of sub-100 nm trenches with copper or copper-manganes...