Add to ORKGThesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1991.Includes bibliographical references (leaves 18-19)U of I OnlyTheses restricted to UIUC community onl
Franz–Keldysh oscillations from GaAs and AlGaAs structures have been studied and we find that the el...
Fourier transformation (FT) has been used in the theoretical line shape analysis of Franz-Keldysh os...
Photoluminescence study of GaAs homoepitaxial structures with different in situ substrate surface cl...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Liberal Arts and Sciences -- University of Illinois at Urbana-Champaign, 1989.Inclu...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1990.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Photoreflectance measurements of a GaAs p‐i‐n diode as a function of temperature (50–450 K) are repo...
Photoellipsometry, a new contactless optical method, is presented, Related to photoreflectance, this...
A photoreflectance measurement system has been designed and implemented. The system provides a sensi...
Photoreflectance (PR) experiments are performed on thick GaAs/GaAs epitaxial layers and on a nearly ...
Three optical spectroscopic techniques commonly used for the measurement of the surface electric fie...
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
Franz–Keldysh oscillations from GaAs and AlGaAs structures have been studied and we find that the el...
Fourier transformation (FT) has been used in the theoretical line shape analysis of Franz-Keldysh os...
Photoluminescence study of GaAs homoepitaxial structures with different in situ substrate surface cl...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Liberal Arts and Sciences -- University of Illinois at Urbana-Champaign, 1989.Inclu...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1990.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Photoreflectance measurements of a GaAs p‐i‐n diode as a function of temperature (50–450 K) are repo...
Photoellipsometry, a new contactless optical method, is presented, Related to photoreflectance, this...
A photoreflectance measurement system has been designed and implemented. The system provides a sensi...
Photoreflectance (PR) experiments are performed on thick GaAs/GaAs epitaxial layers and on a nearly ...
Three optical spectroscopic techniques commonly used for the measurement of the surface electric fie...
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
Franz–Keldysh oscillations from GaAs and AlGaAs structures have been studied and we find that the el...
Fourier transformation (FT) has been used in the theoretical line shape analysis of Franz-Keldysh os...
Photoluminescence study of GaAs homoepitaxial structures with different in situ substrate surface cl...