Many programs exhibit application level error resilience which allows certain subcomputations to execute in an imprecise, yet energy efficient manner, potentially yielding significant overall energy savings without sacrificing end- to-end quality. In this thesis we identify one fundamental problem that must be addressed to realize these energy benefits: even in applications with a large degree of error resilience, error resilient instructions are interleaved with instructions that must be executed precisely at a fine-grained level (about every seven instructions). This interleaving prohibits any energy savings due to the significant costs associated with switching between the modes, typically via voltage scaling, which may require hundreds ...
Abstract: Soft error is a temporal malfunction, which does not leave any permanent damages in the ...
As silicon integration technology pushes toward atomic dimensions, errors due to static and dynamic ...
As silicon integration technology pushes toward atomic dimensions, errors due to static and dynamic ...
Many programs exhibit application level error resilience which allows certain subcomputations to exe...
Conventional CAD methodologies optimize a processor module for correct operation and prohibit timing...
Conventional computer-aided design (CAD) methodologies optimize a processor module for correct opera...
To alleviate the memory wall problem, current architectural trends suggest implementing large instru...
Dual-core execution (DCE) is an execution paradigm proposed to utilize chip multiprocessors to impro...
Timing speculation has been proposed as a technique for maximizing energy efficiency of processors w...
A computer consists of multiple components such as functional units, cache and main memory. At each ...
Around 2003, newly activated power constraints caused single-thread performance growth to slow drama...
Dual-core execution (DCE) is an execution paradigm proposed to utilize chip multiprocessors to impro...
Current processor designs have a critical operating point that sets a hard limit on voltage scaling....
In this paper, we propose a design paradigm for energy efficient and variation-aware operation of ne...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Abstract: Soft error is a temporal malfunction, which does not leave any permanent damages in the ...
As silicon integration technology pushes toward atomic dimensions, errors due to static and dynamic ...
As silicon integration technology pushes toward atomic dimensions, errors due to static and dynamic ...
Many programs exhibit application level error resilience which allows certain subcomputations to exe...
Conventional CAD methodologies optimize a processor module for correct operation and prohibit timing...
Conventional computer-aided design (CAD) methodologies optimize a processor module for correct opera...
To alleviate the memory wall problem, current architectural trends suggest implementing large instru...
Dual-core execution (DCE) is an execution paradigm proposed to utilize chip multiprocessors to impro...
Timing speculation has been proposed as a technique for maximizing energy efficiency of processors w...
A computer consists of multiple components such as functional units, cache and main memory. At each ...
Around 2003, newly activated power constraints caused single-thread performance growth to slow drama...
Dual-core execution (DCE) is an execution paradigm proposed to utilize chip multiprocessors to impro...
Current processor designs have a critical operating point that sets a hard limit on voltage scaling....
In this paper, we propose a design paradigm for energy efficient and variation-aware operation of ne...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Abstract: Soft error is a temporal malfunction, which does not leave any permanent damages in the ...
As silicon integration technology pushes toward atomic dimensions, errors due to static and dynamic ...
As silicon integration technology pushes toward atomic dimensions, errors due to static and dynamic ...