Two forms of variation, namely, Spatial or Process Variation, and Temporal Variation or Aging, are becoming severe limiters of performance scaling provided by the Moore's law in the sub-45nm regime. Process variation affects processor pipelines by making some stages slower and others faster, therefore exacerbating pipeline unbalance. This reduces the frequency attainable by the pipeline. To improve performance, we propose ReCycle, an architectural framework that comprehensively applies cycle time stealing to the pipeline - transferring the time slack of the faster stages to the slow ones by skewing clock arrival times to latching elements after fabrication. As a result, the pipeline can be clocked with a period close to the average stage...
Abstract—Time-dependent performance degradation due to transistor aging caused by mechanisms such as...
Negative bias temperature instability (NBTI) has emerged as a major concern not only to the function...
Bias Temperature Instability (BTI) and Hot Carrier Injection (HCI) are two major causes for transist...
Two forms of variation, namely, Spatial or Process Variation, and Temporal Variation or Aging, are b...
Two forms of variation, namely, Spatial or Process Variation, and Temporal Variation or Aging, are b...
Two forms of variation, namely, Spatial or Process Variation, and Temporal Variation or Aging, are b...
Process variation affects processor pipelines by making some stages slower and others faster, theref...
105 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.To address this problem, we s...
105 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.To address this problem, we s...
Abstract—As complementary metal–oxide–semiconductor technologies enter nanometer scales, microproces...
One of the challenges faced today in the design of microprocessors is to obtain power, performance s...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2007.Using this model we introduce...
As transistor feature sizes continue to shrink into the sub-90nm range and beyond, the effects of pr...
Submitted for publication. Please do not distribute. Although device scaling has been providing stea...
As integrated-circuit technology continues to scale, process variation is becoming an issue that can...
Abstract—Time-dependent performance degradation due to transistor aging caused by mechanisms such as...
Negative bias temperature instability (NBTI) has emerged as a major concern not only to the function...
Bias Temperature Instability (BTI) and Hot Carrier Injection (HCI) are two major causes for transist...
Two forms of variation, namely, Spatial or Process Variation, and Temporal Variation or Aging, are b...
Two forms of variation, namely, Spatial or Process Variation, and Temporal Variation or Aging, are b...
Two forms of variation, namely, Spatial or Process Variation, and Temporal Variation or Aging, are b...
Process variation affects processor pipelines by making some stages slower and others faster, theref...
105 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.To address this problem, we s...
105 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.To address this problem, we s...
Abstract—As complementary metal–oxide–semiconductor technologies enter nanometer scales, microproces...
One of the challenges faced today in the design of microprocessors is to obtain power, performance s...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2007.Using this model we introduce...
As transistor feature sizes continue to shrink into the sub-90nm range and beyond, the effects of pr...
Submitted for publication. Please do not distribute. Although device scaling has been providing stea...
As integrated-circuit technology continues to scale, process variation is becoming an issue that can...
Abstract—Time-dependent performance degradation due to transistor aging caused by mechanisms such as...
Negative bias temperature instability (NBTI) has emerged as a major concern not only to the function...
Bias Temperature Instability (BTI) and Hot Carrier Injection (HCI) are two major causes for transist...