It is getting increasingly difficult to verify processors and guarantee subsequent reliable operation. The complexity of processors is rapidly increasing with every new generation, leading to an increase in the number of design defects, ie. logical bugs in RTL. Simultaneously, with every new generation, process variations are making it tougher to ensure timing closure, leading to an increased susceptibility to timing faults. In this thesis we characterize and propose solutions to mitigate the effects of such congenital faults. Now, for RTL bugs, the problem is compounded by the fact that some of the bugs are not reproducible. Due to several sources of non-determinism in the system like interrupts and i/o, variable bus latencies, memory r...
Soft error tolerance is a hot research topic for modern microprocessors. We have been investigating ...
With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasin...
Past years have seen intense research on reliability techniques for error detection recovery at vari...
It is getting increasingly difficult to verify processors and guarantee subsequent reliable operatio...
Abstract—Manufacturing and environmental variations cause timing errors in microelectronic processor...
Manufacturing and environmental variations cause timing errors in microelectronic processors that a...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
One of the challenges faced today in the design of microprocessors is to obtain power, performance s...
Microelectronic scaling has entered into the nanoscale era with tremendous capacity and performance ...
The operating clock frequency is determined by the longest signal propagation delay, setup/hold time...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
In this paper, we demonstrate that the sensitized path delays in various microprocessor pipe stages ...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
Soft error tolerance is a hot research topic for modern microprocessors. We have been investigating ...
With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasin...
Past years have seen intense research on reliability techniques for error detection recovery at vari...
It is getting increasingly difficult to verify processors and guarantee subsequent reliable operatio...
Abstract—Manufacturing and environmental variations cause timing errors in microelectronic processor...
Manufacturing and environmental variations cause timing errors in microelectronic processors that a...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
One of the challenges faced today in the design of microprocessors is to obtain power, performance s...
Microelectronic scaling has entered into the nanoscale era with tremendous capacity and performance ...
The operating clock frequency is determined by the longest signal propagation delay, setup/hold time...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
In this paper, we demonstrate that the sensitized path delays in various microprocessor pipe stages ...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
Soft error tolerance is a hot research topic for modern microprocessors. We have been investigating ...
With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasin...
Past years have seen intense research on reliability techniques for error detection recovery at vari...