Our current study focuses on an analysis of the ballistic electron emission microscopy(BEEM) spectra of Au/(AlGa) As heterostructures to estimate quantitatively the effect of thecarrier scattering in the metal, at the metal-semiconductor (ms) interface and in thesemiconductor on the multivalley carrier transport. The second derivative (SD)-BEEM spectra,representing the heterostructure transmission coefficient, show explicit partitioning of thecontribution of different transport channels (T, L and X conduction valleys). Our analysis of SD-BEEM spectra by the developed theoretical model indicates that about 85-92% of the BEEMelectrons are scattered at the nonepitaxial Au/GaAs interface. We also show that initial electrondistribution among the...
Ballistic electron emission microscopy (BEEM) is a powerful new low energy electron microscopy in ma...
Ballisticelectron emission spectroscopy (BEES) was used to determine the electron barrier height at ...
Ballistic electron emission spectroscopy (BEES) has been used to determine the conduction-band offse...
Ballistic-electron-emission microscopy (BEEM) has been used to measure the band structure of both Au...
In 1988, Kaiser and Bell first demonstrated the unique capability of Ballistic Electron Emission Mic...
We present an interface scattering model to describe ballistic-electron-emission microscopy (BEEM) a...
Ballistic electron emission microscopy (BEEM) has been used to investigate the Au/n-ZnSe contact at ...
We present a theoretical framework well suited to analyze ballistic electron emission microscopy (BE...
Through the results obtained on Au-Si(100) junctions, we show the main aspects of Ballistic Electron...
Ballistic electron emission microscopy (BEEM) has been used to study electron transport across singl...
Ballistic Electron Emission Microscopy (BEEM) has been shown to be a powerful tool for nanometer-sca...
We report an extensive investigation of semiconductor band-structure effects in single-barrier A...
PACS. 61.16Ch { Scanning probe microscopy: scanning tunneling, atomic force, scanning opti-cal, magn...
BEEM is a powerful, new low energy electron microscopy for imaging and spectroscopy of buried quantu...
BEEM is a powerful, new low energy electron microscopy for imaging and spectroscopy of buried quantu...
Ballistic electron emission microscopy (BEEM) is a powerful new low energy electron microscopy in ma...
Ballisticelectron emission spectroscopy (BEES) was used to determine the electron barrier height at ...
Ballistic electron emission spectroscopy (BEES) has been used to determine the conduction-band offse...
Ballistic-electron-emission microscopy (BEEM) has been used to measure the band structure of both Au...
In 1988, Kaiser and Bell first demonstrated the unique capability of Ballistic Electron Emission Mic...
We present an interface scattering model to describe ballistic-electron-emission microscopy (BEEM) a...
Ballistic electron emission microscopy (BEEM) has been used to investigate the Au/n-ZnSe contact at ...
We present a theoretical framework well suited to analyze ballistic electron emission microscopy (BE...
Through the results obtained on Au-Si(100) junctions, we show the main aspects of Ballistic Electron...
Ballistic electron emission microscopy (BEEM) has been used to study electron transport across singl...
Ballistic Electron Emission Microscopy (BEEM) has been shown to be a powerful tool for nanometer-sca...
We report an extensive investigation of semiconductor band-structure effects in single-barrier A...
PACS. 61.16Ch { Scanning probe microscopy: scanning tunneling, atomic force, scanning opti-cal, magn...
BEEM is a powerful, new low energy electron microscopy for imaging and spectroscopy of buried quantu...
BEEM is a powerful, new low energy electron microscopy for imaging and spectroscopy of buried quantu...
Ballistic electron emission microscopy (BEEM) is a powerful new low energy electron microscopy in ma...
Ballisticelectron emission spectroscopy (BEES) was used to determine the electron barrier height at ...
Ballistic electron emission spectroscopy (BEES) has been used to determine the conduction-band offse...