In this paper, we report a systematic study of low frequency 1/f<SUP>α</SUP> resistance fluctuation in thin metal films (Ag on Si) at different stages of damage process when the film is subjected to high current stressing. The resistance fluctuation (noise) measurement was carried out in situ using a small ac bias that has been mixed with the dc stressing current. The experiment has been carried out as a function of temperature in the range of 150-350 K. The experiment establishes that the current stressed film, as it undergoes damage due to various migration forces, develops an additional low-frequency noise spectral power that does not have the usual 1/f spectral shape. The magnitude of extra term has an activated temperature depende...
Mechanical stress and current-induced degradation can provoke holes and kinks in thin conducting fil...
Mechanical stress and current-induced degradation can provoke holes and kinks in thin conducting fil...
Mechanical stress and current-induced degradation can provoke holes and kinks in thin conducting fil...
In this paper, we report a systematic study of low frequency 1∕fα resistance fluctuation in thin met...
In this paper we report a systematic study of low-frequency 1/fα resistance fluctuation in a metal f...
In this paper we report a systematic study of low-frequency 1/fα resistance fluctuation in a metal f...
In this paper we report a systematic study of low-frequency 1/fα resistance fluctuation in a metal f...
We have studied the conductance fluctuation in metal film which is under electromigration stressing....
We have studied the conductance fluctuation in metal film which is under electromigration stressing....
Investigations of low-frequency conductance fluctuations have been done on silver films which have b...
[[abstract]]Noise measurements were performed on electromigration-damaged single-layer AlSiCu films,...
Electromigration (EM) in thin Al and Al/Si resistors was investigated by measuring the effect of the...
In this paper direct observation of the evolution of local temperature inhomogeneity and the resulti...
In this paper direct observation of the evolution of local temperature inhomogeneity and the resulti...
We have investigated the. kinetics of current-induced change of resistance and conductivity noise in...
Mechanical stress and current-induced degradation can provoke holes and kinks in thin conducting fil...
Mechanical stress and current-induced degradation can provoke holes and kinks in thin conducting fil...
Mechanical stress and current-induced degradation can provoke holes and kinks in thin conducting fil...
In this paper, we report a systematic study of low frequency 1∕fα resistance fluctuation in thin met...
In this paper we report a systematic study of low-frequency 1/fα resistance fluctuation in a metal f...
In this paper we report a systematic study of low-frequency 1/fα resistance fluctuation in a metal f...
In this paper we report a systematic study of low-frequency 1/fα resistance fluctuation in a metal f...
We have studied the conductance fluctuation in metal film which is under electromigration stressing....
We have studied the conductance fluctuation in metal film which is under electromigration stressing....
Investigations of low-frequency conductance fluctuations have been done on silver films which have b...
[[abstract]]Noise measurements were performed on electromigration-damaged single-layer AlSiCu films,...
Electromigration (EM) in thin Al and Al/Si resistors was investigated by measuring the effect of the...
In this paper direct observation of the evolution of local temperature inhomogeneity and the resulti...
In this paper direct observation of the evolution of local temperature inhomogeneity and the resulti...
We have investigated the. kinetics of current-induced change of resistance and conductivity noise in...
Mechanical stress and current-induced degradation can provoke holes and kinks in thin conducting fil...
Mechanical stress and current-induced degradation can provoke holes and kinks in thin conducting fil...
Mechanical stress and current-induced degradation can provoke holes and kinks in thin conducting fil...