In this paper, we describe the effects of nonlinear tip-sample forces on dynamic mode atomic force microscopy and spectroscopy. The jumps and hysteresis observed in the vibration amplitude (A) versus tip-sample distance (h) curves have been traced to bistability in the resonance curve. A numerical analysis of the basic dynamic equation was used to explain the hysteresis in the experimental curve. It has been found that the location of the hysteresis in the A-h curve depends on the frequency of the forced oscillation relative to the natural frequency of the cantilever
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their a...
The cantilever-sample system of an atomic force acoustic microscope is excited in the frequency rang...
As one branch of atomic force microscopy (AFM), dynamic atomic force microscopy (Dynamic AFM) uses a...
There are several techniques which combine atomic force microscopy with ultrasonics. In atomic force...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Dynamic force microscopy (DFM) utilizes the dynamic response of a resonating probe tip as it approac...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Tapping-mode atomic force microscopy has wide applica-tions for probing the nanoscale surface and su...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their a...
The cantilever-sample system of an atomic force acoustic microscope is excited in the frequency rang...
As one branch of atomic force microscopy (AFM), dynamic atomic force microscopy (Dynamic AFM) uses a...
There are several techniques which combine atomic force microscopy with ultrasonics. In atomic force...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Dynamic force microscopy (DFM) utilizes the dynamic response of a resonating probe tip as it approac...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and sub...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Tapping-mode atomic force microscopy has wide applica-tions for probing the nanoscale surface and su...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...